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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 38, Iss. 19 — Oct. 1, 2013
  • pp: 3969–3972

Spectroscopic ellipsometry on metal and metal-oxide multilayer hybrid plasmonic nanostructures

Akram A. Khosroabadi, Palash Gangopadhyay, Byron Cocilovo, Laszlo Makai, Peter Basa, Binh Duong, Jayan Thomas, and Robert A. Norwood  »View Author Affiliations

Optics Letters, Vol. 38, Issue 19, pp. 3969-3972 (2013)

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The effective medium approximation is used to determine the optical constants of novel silver (Ag)/indium-tin oxide (ITO) multilayer nanopillar structures within the 300–800 nm wavelength range. The structures are modeled as inclusions in air with the pillar volume fraction at 42.4%, agreeing with SEM images of the sample. The simulated reflection intensity of the nanopillars is much less than that of the planar reference sample and is a result of the small difference between the refractive index of the top effective medium layer and that of air. Furthermore, the minimum in the reflection at around 450 nm in the nanostructured sample is evidence of surface plasmon enhancement, indicating suitability for plasmonic applications. The simulated Brewster angle decreases in the pillar region, which is an indication of smaller effective refractive index.

© 2013 Optical Society of America

OCIS Codes
(250.5403) Optoelectronics : Plasmonics
(310.6628) Thin films : Subwavelength structures, nanostructures
(240.2130) Optics at surfaces : Ellipsometry and polarimetry

ToC Category:

Original Manuscript: August 2, 2013
Revised Manuscript: August 21, 2013
Manuscript Accepted: August 26, 2013
Published: September 30, 2013

Akram A. Khosroabadi, Palash Gangopadhyay, Byron Cocilovo, Laszlo Makai, Peter Basa, Binh Duong, Jayan Thomas, and Robert A. Norwood, "Spectroscopic ellipsometry on metal and metal-oxide multilayer hybrid plasmonic nanostructures," Opt. Lett. 38, 3969-3972 (2013)

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