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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 38, Iss. 20 — Oct. 15, 2013
  • pp: 4066–4069

Coherent total internal reflection dark-field microscopy: label-free imaging beyond the diffraction limit

Philipp von Olshausen and Alexander Rohrbach  »View Author Affiliations

Optics Letters, Vol. 38, Issue 20, pp. 4066-4069 (2013)

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Coherent imaging is barely applicable in life-science microscopy due to multiple interference artifacts. Here, we show how these interferences can be used to improve image resolution and contrast. We present a dark-field microscopy technique with evanescent illumination via total internal reflection that delivers high-contrast images of coherently scattering samples. By incoherent averaging of multiple coherent images illuminated from different directions we can resolve image structures that remain unresolved by conventional (incoherent) fluorescence microscopy. We provide images of 190 nm beads revealing resolution beyond the diffraction limit and slightly increased object distances. An analytical model is introduced that accounts for the observed effects and which is confirmed by numerical simulations. Our approach may be a route to fast, label-free, super-resolution imaging in live-cell microscopy.

© 2013 Optical Society of America

OCIS Codes
(030.1670) Coherence and statistical optics : Coherent optical effects
(070.6110) Fourier optics and signal processing : Spatial filtering
(180.0180) Microscopy : Microscopy
(290.0290) Scattering : Scattering

ToC Category:

Original Manuscript: June 13, 2013
Revised Manuscript: August 13, 2013
Manuscript Accepted: September 9, 2013
Published: October 7, 2013

Philipp von Olshausen and Alexander Rohrbach, "Coherent total internal reflection dark-field microscopy: label-free imaging beyond the diffraction limit," Opt. Lett. 38, 4066-4069 (2013)

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