OSA's Digital Library

Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 38, Iss. 20 — Oct. 15, 2013
  • pp: 4100–4103

Conical refraction as a tool for polarization metrology

Alba Peinado, Alex Turpin, Angel Lizana, Estefania Fernández, Jordi Mompart, and Juan Campos  »View Author Affiliations

Optics Letters, Vol. 38, Issue 20, pp. 4100-4103 (2013)

View Full Text Article

Enhanced HTML    Acrobat PDF (361 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



A method for polarization metrology based on the conical refraction (CR) phenomenon, occurring in biaxial crystals, is reported. CR transforms an input Gaussian beam into a light ring whose intensity distribution is linked to the incoming polarization. We present the design of a division-of-amplitude complete polarimeter composed of two biaxial crystals, whose measurement principle is based on the CR phenomenon. This design corresponds to a static polarimeter, that is, without mechanical movements or electrical signal addressing. Only one division-of-amplitude device is required, besides the two biaxial crystals, to completely characterize any state of polarization, including partially polarized and unpolarized states. In addition, a mathematical model describing the system is included. Experimental images of the intensity distribution related to different input polarization states are provided. These intensity patterns are compared with simulated values, proving the potential of polarimeters based on biaxial crystals.

© 2013 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(160.1190) Materials : Anisotropic optical materials
(260.1180) Physical optics : Crystal optics
(260.1440) Physical optics : Birefringence

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: June 19, 2013
Revised Manuscript: September 5, 2013
Manuscript Accepted: September 6, 2013
Published: October 9, 2013

Alba Peinado, Alex Turpin, Angel Lizana, Estefania Fernández, Jordi Mompart, and Juan Campos, "Conical refraction as a tool for polarization metrology," Opt. Lett. 38, 4100-4103 (2013)

Sort:  Author  |  Year  |  Journal  |  Reset  


  1. A. Pierangelo, A. Benali, M. R. Antonelli, T. Novikova, P. Validire, B. Gayet, and A. De Martino, Opt. Express 19, 1582 (2011). [CrossRef]
  2. A. Lizana, M. Foldyna, M. Stchakovsky, B. Georges, D. Nicolas, and E. Garcia-Caurel, J. Phys. D 46, 105501 (2013). [CrossRef]
  3. N. Uribe-Patarroyo, A. Alvarez-Herrero, R. L. Heredero, J. C. del Toro Iniesta, A. C. López Jiménez, V. Domingo, J. L. Gasent, L. Jochum, and V. Martínez Pillet, Phys. Status Solidi C 5, 1041 (2008). [CrossRef]
  4. D. H. Goldstein, Polarized Light, 3rd ed. (CRC Press, 2010).
  5. A. Peinado, A. Lizana, J. Vidal, C. Iemmi, and J. Campos, Opt. Express 18, 9815 (2010). [CrossRef]
  6. D. S. Sabatke, M. R. Descour, E. L. Dereniak, W. C. Sweatt, S. A. Kemme, and G. S. Phipps, Opt. Lett. 25, 802 (2000). [CrossRef]
  7. E. Garcia-Caurel, A. De Martino, and B. Drévillon, Thin Solid Films 455–456, 120 (2004). [CrossRef]
  8. D. H. Goldstein, Appl. Opt. 31, 6676 (1992). [CrossRef]
  9. O. Arteaga, J. Freudenthal, B. Wang, and B. Kahr, Appl. Opt. 51, 6805 (2012). [CrossRef]
  10. E. Compain and B. Drevillon, Appl. Opt. 37, 5938 (1998). [CrossRef]
  11. D. H. Goldstein and R. A. Chipman, J. Opt. Soc. Am. A 7, 693 (1990). [CrossRef]
  12. R. A. Chipman, in Handbook of Optics, 2nd ed. (McGraw-Hill, 1995).
  13. M. V. Berry and M. R. Jeffrey, Prog. Opt. 50, 13 (2007). [CrossRef]
  14. A. M. Belskii and A. P. Khapalyuk, Opt. Spectrosc. 44, 436 (1978).
  15. T. K. Kalkandjiev and M. A. Bursukova, Proc. SPIE 6994, 69940B (2008). [CrossRef]
  16. A. Turpin, Y. V. Loiko, T. K. Kalkandjiev, and J. Mompart, Opt. Lett. 38, 1455 (2013). [CrossRef]
  17. A. Turpin, Y. Loiko, T. K. Kalkandjiev, and J. Mompart, Opt. Lett. 37, 4197 (2012). [CrossRef]
  18. A. Abdolvand, K. G. Wilcox, T. K. Kalkandjiev, and E. U. Rafailov, Opt. Express 18, 2753 (2010). [CrossRef]
  19. D. P. O’Dwyer, C. F. Phelan, K. E. Ballantine, Y. P. Rakovich, J. G. Lunney, and J. F. Donegan, Opt. Express 18, 27319 (2010). [CrossRef]
  20. M. V. Berry, M. R. Jeffrey, and J. G. Lunney, Proc. R. Soc. London, Ser. A 462, 1629 (2006). [CrossRef]
  21. Y. Mikhailichenko, Russ. Phys. J. 50, 788 (2007). [CrossRef]
  22. D. H. Goldstein, Polarized Light, 2nd ed. (Marcel Dekker, 2003).
  23. P. Taylor, Theory and Applications of Numerical Analysis, 2nd ed. (Academic, 1996).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited