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Optics Letters

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  • Editor: Alan E. Willner
  • Vol. 38, Iss. 20 — Oct. 15, 2013
  • pp: 4100–4103

Conical refraction as a tool for polarization metrology

Alba Peinado, Alex Turpin, Angel Lizana, Estefania Fernández, Jordi Mompart, and Juan Campos  »View Author Affiliations


Optics Letters, Vol. 38, Issue 20, pp. 4100-4103 (2013)
http://dx.doi.org/10.1364/OL.38.004100


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Abstract

A method for polarization metrology based on the conical refraction (CR) phenomenon, occurring in biaxial crystals, is reported. CR transforms an input Gaussian beam into a light ring whose intensity distribution is linked to the incoming polarization. We present the design of a division-of-amplitude complete polarimeter composed of two biaxial crystals, whose measurement principle is based on the CR phenomenon. This design corresponds to a static polarimeter, that is, without mechanical movements or electrical signal addressing. Only one division-of-amplitude device is required, besides the two biaxial crystals, to completely characterize any state of polarization, including partially polarized and unpolarized states. In addition, a mathematical model describing the system is included. Experimental images of the intensity distribution related to different input polarization states are provided. These intensity patterns are compared with simulated values, proving the potential of polarimeters based on biaxial crystals.

© 2013 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(160.1190) Materials : Anisotropic optical materials
(260.1180) Physical optics : Crystal optics
(260.1440) Physical optics : Birefringence

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: June 19, 2013
Revised Manuscript: September 5, 2013
Manuscript Accepted: September 6, 2013
Published: October 9, 2013

Citation
Alba Peinado, Alex Turpin, Angel Lizana, Estefania Fernández, Jordi Mompart, and Juan Campos, "Conical refraction as a tool for polarization metrology," Opt. Lett. 38, 4100-4103 (2013)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-38-20-4100


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