Structured illumination microscopy (SIM) is a powerful technique for obtaining super-resolved fluorescence maps of samples, but it is very sensitive to aberrations or misalignments affecting the excitation patterns. Here, we present a reconstruction algorithm that is able to process SIM data even if the illuminations are strongly distorted. The approach is an extension of the recent blind-SIM technique, which reconstructs simultaneously the sample and the excitation patterns without a priori information on the latter. Our algorithm was checked on synthetic and experimental data using distorted and nondistorted illuminations. The reconstructions were similar to that obtained by up-to-date SIM methods when the illuminations were periodic and remained artifact-free when the illuminations were strongly distorted.
© 2013 Optical Society of America
Original Manuscript: May 30, 2013
Revised Manuscript: September 12, 2013
Manuscript Accepted: October 4, 2013
Published: November 12, 2013
Vol. 9, Iss. 1 Virtual Journal for Biomedical Optics
R. Ayuk, H. Giovannini, A. Jost, E. Mudry, J. Girard, T. Mangeat, N. Sandeau, R. Heintzmann, K. Wicker, K. Belkebir, and A. Sentenac, "Structured illumination fluorescence microscopy with distorted excitations using a filtered blind-SIM algorithm," Opt. Lett. 38, 4723-4726 (2013)