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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 38, Iss. 22 — Nov. 15, 2013
  • pp: 4785–4788

Far-field polarization characterization of the fundamental modes of a strip silicon waveguide

Jian Wang, Justin C. Wirth, Yi Xuan, Daniel E. Leaird, Andrew M. Weiner, and Minghao Qi  »View Author Affiliations

Optics Letters, Vol. 38, Issue 22, pp. 4785-4788 (2013)

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The fundamental quasi-TE and quasi-TM modes of a sub-wavelength strip silicon waveguide are not purely TE or TM as the plane waves in free space. We investigate theoretically and experimentally the far-field polarization compositions of the two waveguide modes after they emanate from the waveguide facet. The measured polarization extinction ratios (PERs) of 31 dB for the quasi-TM mode and 26 dB for quasi-TE mode using free-space polarizers are consistent with our numerical analysis. Moreover, our far-field simulations show that the free-space measurement of PERs is influenced, and in many cases limited, by the sizes of various apertures in the experimental setup. This suggests a potential trade-off between achievable PERs and overall power detection/collection efficiency.

© 2013 Optical Society of America

OCIS Codes
(230.3120) Optical devices : Integrated optics devices
(230.7370) Optical devices : Waveguides
(130.5440) Integrated optics : Polarization-selective devices

ToC Category:
Optical Devices

Original Manuscript: September 16, 2013
Manuscript Accepted: October 2, 2013
Published: November 12, 2013

Jian Wang, Justin C. Wirth, Yi Xuan, Daniel E. Leaird, Andrew M. Weiner, and Minghao Qi, "Far-field polarization characterization of the fundamental modes of a strip silicon waveguide," Opt. Lett. 38, 4785-4788 (2013)

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