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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 38, Iss. 22 — Nov. 15, 2013
  • pp: 4896–4899

White light lateral shear interferometer with holographic shear lenses and spatial Fourier transform

Charles Joenathan, Yanzeng Li, Wanseok Oh, Robert M. Bunch, Ashley Bernal, and Scott R. Kirkpatrick  »View Author Affiliations


Optics Letters, Vol. 38, Issue 22, pp. 4896-4899 (2013)
http://dx.doi.org/10.1364/OL.38.004896


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Abstract

Lateral shear interferometer is a simple yet powerful method for testing wavefronts or measuring refractive index changes. Previously, we have reported a method of using two holographic lenses to obtain shear and to generate a spatial frequency carrier, which was used for quantitative analysis. This technique has some advantages such as stability and instantaneous measurements. In this Letter, we report a method of using white light with holographic gratings to obtain shear and also to perform wavefront analysis using the spatial carrier fringes generated at a specific selected wavelength from the white light spectrum. We show that the sensitivity of the setup can be changed by selecting different wavelengths from the spectrum.

© 2013 Optical Society of America

OCIS Codes
(070.0070) Fourier optics and signal processing : Fourier optics and signal processing
(070.6110) Fourier optics and signal processing : Spatial filtering
(090.2890) Holography : Holographic optical elements
(120.3180) Instrumentation, measurement, and metrology : Interferometry

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: August 27, 2013
Revised Manuscript: October 12, 2013
Manuscript Accepted: October 15, 2013
Published: November 15, 2013

Citation
Charles Joenathan, Yanzeng Li, Wanseok Oh, Robert M. Bunch, Ashley Bernal, and Scott R. Kirkpatrick, "White light lateral shear interferometer with holographic shear lenses and spatial Fourier transform," Opt. Lett. 38, 4896-4899 (2013)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-38-22-4896

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