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Optics Letters

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  • Editor: Alan E. Willner
  • Vol. 38, Iss. 24 — Dec. 15, 2013
  • pp: 5299–5302

Mutual interferometric characterization of a pair of independent electric fields

Charles Bourassin-Bouchet, Matthias M. Mang, Ilaria Gianani, and Ian A. Walmsley  »View Author Affiliations


Optics Letters, Vol. 38, Issue 24, pp. 5299-5302 (2013)
http://dx.doi.org/10.1364/OL.38.005299


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Abstract

We demonstrate a novel interferometric characterization scheme that allows the complete reconstruction of two interfering electric fields. The phase profiles of both beams, and their relative phase, can be retrieved simultaneously as a function of any degree of freedom in which it is possible to shear one of the beams. The method has applications in wavefront sensing or ultrashort-pulse measurement, especially also in the domain of extreme light sources where it is difficult to generate a reference field or to replicate the beam in order to perform a self-referencing measurement. We demonstrate the technique experimentally by measuring simultaneously two ultrashort pulses in a single laser shot.

© 2013 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(320.7100) Ultrafast optics : Ultrafast measurements

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: October 16, 2013
Manuscript Accepted: October 27, 2013
Published: December 5, 2013

Virtual Issues
December 24, 2013 Spotlight on Optics

Citation
Charles Bourassin-Bouchet, Matthias M. Mang, Ilaria Gianani, and Ian A. Walmsley, "Mutual interferometric characterization of a pair of independent electric fields," Opt. Lett. 38, 5299-5302 (2013)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-38-24-5299


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