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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 38, Iss. 24 — Dec. 15, 2013
  • pp: 5438–5441

Accurate determination of terahertz optical constants by vector network analyzer of Fabry–Perot response

Wenfeng Sun, Bin Yang, Xinke Wang, Yan Zhang, and Robert Donnan  »View Author Affiliations


Optics Letters, Vol. 38, Issue 24, pp. 5438-5441 (2013)
http://dx.doi.org/10.1364/OL.38.005438


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Abstract

We present a method based on a Fabry–Perot model to efficiently and accurately estimate optical constants of wafer samples in transmission-only measurements performed by a vector network analyzer (VNA). The method is demonstrated on two separate wafer samples: one of silicon and the other of polymethylmethacrylate. Results show that the method can not only acquire optical constants accurately and simply over a broad frequency domain but also overcome the limitations of calculation for dispersive and lossy materials to which existing methods are susceptible, such as those based on VNA-driven quasi-optical transmissometers and terahertz time-domain spectrometry.

© 2013 Optical Society of America

OCIS Codes
(120.2230) Instrumentation, measurement, and metrology : Fabry-Perot
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(300.6495) Spectroscopy : Spectroscopy, teraherz

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: October 8, 2013
Revised Manuscript: November 13, 2013
Manuscript Accepted: November 13, 2013
Published: December 13, 2013

Citation
Wenfeng Sun, Bin Yang, Xinke Wang, Yan Zhang, and Robert Donnan, "Accurate determination of terahertz optical constants by vector network analyzer of Fabry–Perot response," Opt. Lett. 38, 5438-5441 (2013)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-38-24-5438

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