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Two-mode interference measurement for nanometer accuracy absolute ranging |
Optics Letters, Vol. 38, Issue 3, pp. 281-283 (2013)
http://dx.doi.org/10.1364/OL.38.000281
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Abstract
We demonstrate a laser ranging scheme that uses a high-frequency modulated beam to achieve subnanometer precision by the combined use of interferometric and time-of-flight measurements. We first describe how the absolute distance is extracted from a two-mode interference signal. In particular, we show that the signal, which presents both optical and synthetic wavelength scales, allows one to achieve nanometer-scale accuracy, despite the significant long-term phase drifts in the 20 GHz detection chains. We present results obtained with the telemeter implemented for a distance of about four meters, obtained by folding the laser beam path to the target.
© 2013 Optical Society of America
OCIS Codes
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(260.3160) Physical optics : Interference
(280.3400) Remote sensing and sensors : Laser range finder
(120.6085) Instrumentation, measurement, and metrology : Space instrumentation
ToC Category:
Remote Sensing and Sensors
History
Original Manuscript: October 9, 2012
Revised Manuscript: December 7, 2012
Manuscript Accepted: December 17, 2012
Published: January 17, 2013
Citation
Duy-Ha Phung, Christophe Alexandre, and Michel Lintz, "Two-mode interference measurement for nanometer accuracy absolute ranging," Opt. Lett. 38, 281-283 (2013)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-38-3-281
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