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Genetic method to optimize binary dithering technique for high-quality fringe generation |
Optics Letters, Vol. 38, Issue 4, pp. 540-542 (2013)
http://dx.doi.org/10.1364/OL.38.000540
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Abstract
The recently proposed dithering techniques could substantially improve measurement quality when fringes are wide, but offer limited improvement when fringes are narrow. This Letter presents a genetic algorithm to optimize the dithering technique for sinusoidal structured pattern representation. We believe both simulation and experimental results show that this proposed algorithm can substantially improve fringe quality for both narrow and wide fringe patterns.
© 2013 Optical Society of America
OCIS Codes
(100.5070) Image processing : Phase retrieval
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: December 18, 2012
Revised Manuscript: January 14, 2013
Manuscript Accepted: January 14, 2013
Published: February 13, 2013
Citation
William Lohry and Song Zhang, "Genetic method to optimize binary dithering technique for high-quality fringe generation," Opt. Lett. 38, 540-542 (2013)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-38-4-540
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