|
Single-image far-field subdiffraction limit imaging with axicon |
Optics Letters, Vol. 38, Issue 5, pp. 625-627 (2013)
http://dx.doi.org/10.1364/OL.38.000625
Enhanced HTML 
Acrobat PDF (367 KB)
Abstract
This Letter presents a technique for subdiffraction limit imaging termed Bessel beam microscopy (BBM). By placing a lens in series with an axicon in the optical path of a microscope, the diffraction-limited resolution of the base microscope is improved by one third. This improvement is demonstrated experimentally by resolving individual subdiffraction limit fluorescent beads in a close-pack arrangement. The behavior of the BBM system is explored using angular diffraction simulations, demonstrating the possibility of resolving features spaced as little as 110 nm apart when viewed with a
© 2013 Optical Society of America
OCIS Codes
(110.0180) Imaging systems : Microscopy
(180.2520) Microscopy : Fluorescence microscopy
ToC Category:
Imaging Systems
History
Original Manuscript: November 5, 2012
Revised Manuscript: January 3, 2013
Manuscript Accepted: January 11, 2013
Published: February 21, 2013
Virtual Issues
Vol. 8, Iss. 4 Virtual Journal for Biomedical Optics
Citation
Craig Snoeyink and Steve Wereley, "Single-image far-field subdiffraction limit imaging with axicon," Opt. Lett. 38, 625-627 (2013)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-38-5-625
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Imaging Properties in Two-Photon Excitation Microscopy and Effects of Refractive-Index Mismatch in Thick Specimens (AO)
- High-Speed, Two-Photon Scanning Microscope (AO)
- Fabrication and Characterization of a Silicon Cantilever Probe with an Integrated Quartz-Glass (Fused-Silica) Tip for Scanning Near-Field Optical Microscopy (AO)
- Multiple-objective microscopy with three-dimensional resolution near 100 nm and a long working distance (OL)
- Saturated patterned excitation microscopy—a concept for optical resolution improvement (JOSAA)
Related Conference Papers
- Two-Photon Microscopy with Adaptive Illumination Power
- Improved Imaging Property of the Scanning Total Internal Reflection Fluorescence Microscope by the Use of Optimally Polarized Illumination
- Trimodal Optical Microscopy
- Logarithmic Output Active Illumination Microscopy
- Fluorescent Nanoscope - experience of transferring science to business
« Previous Article | Next Article »
OSA is a member of 