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Decoupling of geometric thickness and refractive index in quantitative phase microscopy |
Optics Letters, Vol. 38, Issue 6, pp. 1007-1009 (2013)
http://dx.doi.org/10.1364/OL.38.001007
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Abstract
In quantitative phase imaging, a priori knowledge of either refractive index or physical thickness is used to estimate the change in one of these parameters. Here, we report a method for decoupling geometric thickness from refractive index in quantitative phase microscopy.
© 2013 Optical Society of America
OCIS Codes
(070.6110) Fourier optics and signal processing : Spatial filtering
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(170.0180) Medical optics and biotechnology : Microscopy
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: August 22, 2012
Revised Manuscript: February 16, 2013
Manuscript Accepted: February 19, 2013
Published: March 15, 2013
Citation
Nelson Cardenas and Samarendra Mohanty, "Decoupling of geometric thickness and refractive index in quantitative phase microscopy," Opt. Lett. 38, 1007-1009 (2013)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-38-6-1007
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