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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 38, Iss. 6 — Mar. 15, 2013
  • pp: 1007–1009

Decoupling of geometric thickness and refractive index in quantitative phase microscopy

Nelson Cardenas and Samarendra Mohanty  »View Author Affiliations

Optics Letters, Vol. 38, Issue 6, pp. 1007-1009 (2013)

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In quantitative phase imaging, a priori knowledge of either refractive index or physical thickness is used to estimate the change in one of these parameters. Here, we report a method for decoupling geometric thickness from refractive index in quantitative phase microscopy.

© 2013 Optical Society of America

OCIS Codes
(070.6110) Fourier optics and signal processing : Spatial filtering
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(170.0180) Medical optics and biotechnology : Microscopy

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: August 22, 2012
Revised Manuscript: February 16, 2013
Manuscript Accepted: February 19, 2013
Published: March 15, 2013

Virtual Issues
Vol. 8, Iss. 4 Virtual Journal for Biomedical Optics

Nelson Cardenas and Samarendra Mohanty, "Decoupling of geometric thickness and refractive index in quantitative phase microscopy," Opt. Lett. 38, 1007-1009 (2013)

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