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X-ray wavefront characterization of a Fresnel zone plate using a two-dimensional grating interferometer |
Optics Letters, Vol. 38, Issue 6, pp. 827-829 (2013)
http://dx.doi.org/10.1364/OL.38.000827
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Abstract
The x-ray wavefront downstream of a Fresnel zone plate (FZP) was characterized using a two-dimensional grating interferometer. Transverse wavefront slope maps, measured using a raster phase-stepping scan, allowed accurate phase reconstruction of the x-ray beam. Wavefront measurements revealed that the wavefront error is very sensitive to the input beam entering the FZP. A small stack of one-dimensional compound refractive lenses was used to introduce astigmatism in the probing x-ray beam to investigate the contribution of the incoming beam in contrast to the optical aberrations. Experimental data were shown to be consistent with theoretical calculations.
© 2013 Optical Society of America
OCIS Codes
(050.2770) Diffraction and gratings : Gratings
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(340.7450) X-ray optics : X-ray interferometry
ToC Category:
Diffraction and Gratings
History
Original Manuscript: August 24, 2012
Revised Manuscript: November 27, 2012
Manuscript Accepted: February 8, 2013
Published: March 6, 2013
Virtual Issues
Vol. 8, Iss. 4 Virtual Journal for Biomedical Optics
Citation
Hongchang Wang, Sebastien Berujon, Ian Pape, Simon Rutishauser, Christian David, and Kawal Sawhney, "X-ray wavefront characterization of a Fresnel zone plate using a two-dimensional grating interferometer," Opt. Lett. 38, 827-829 (2013)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-38-6-827
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