Abstract
Ferroelectric (BTO) thin films are grown by RF sputtering onto an indium tin oxide bottom electrode on a MgO single-crystal substrate. We have studied here the optical properties by the prism coupling technique. We report the ordinary and extraordinary refractive indices of the films, the film thickness, and the optical losses that are obtained on the planar waveguides: and at 1539 nm. Furthermore, in order to demonstrate the active property of the BTO films, we have investigated the electro-optic (EO) properties by using the change of the resonant coupling angle (variation of fundamental guided mode) when the transverse electric field is applied. The latter is induced by the refractive index variation () caused by the EO effect when a static electric field is applied transversely to the film. The EO coefficient obtain is about for TE mode and for TM modes at 1539 nm. This value illustrates the suitability of the BTO material thin film with a polycrystalline structure for applications such as modulations, switching, and interconnections.
© 2013 Optical Society of America
Full Article | PDF ArticleMore Like This
Yu Cao, Nour Al Meselmene, Elhadj Dogheche, Ping Yang, Parikshit Moitra, Shi Qiang Li, Thirumalai Venkatesan, and Aaron Danner
Opt. Mater. Express 13(1) 152-160 (2023)
Mengxi Luo, DeGui Sun, Na Sun, Yuan Hu, Kaiping Zhang, Desong Wang, Yan Li, Bo Xing, Yeming Xu, and Di Wu
Opt. Lett. 44(17) 4215-4218 (2019)
A. Petraru, J. Schubert, M. Schmid, O. Trithaveesak, and Ch. Buchal
Opt. Lett. 28(24) 2527-2529 (2003)