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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 38, Iss. 7 — Apr. 1, 2013
  • pp: 1173–1175

Complete spatial characterization of an optical wavefront using a variable-separation pinhole pair

David T. Lloyd, Kevin O’Keeffe, and Simon M. Hooker  »View Author Affiliations

Optics Letters, Vol. 38, Issue 7, pp. 1173-1175 (2013)

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We present a technique for measuring the transverse spatial properties of an optical wavefront. Intensity and phase profiles are recovered by analysis of a series of interference patterns produced by the combination of a scanning X-shaped slit and a static horizontal slit; the spatial coherence may be found from the same data. We demonstrate the technique by characterizing high harmonic radiation generated in a gas cell, however the method could be extended to a wide variety of light sources.

© 2013 Optical Society of America

OCIS Codes
(030.1640) Coherence and statistical optics : Coherence
(100.2650) Image processing : Fringe analysis
(190.4160) Nonlinear optics : Multiharmonic generation
(320.0320) Ultrafast optics : Ultrafast optics

ToC Category:
Ultrafast Optics

Original Manuscript: December 13, 2012
Revised Manuscript: March 2, 2013
Manuscript Accepted: March 4, 2013
Published: April 1, 2013

David T. Lloyd, Kevin O’Keeffe, and Simon M. Hooker, "Complete spatial characterization of an optical wavefront using a variable-separation pinhole pair," Opt. Lett. 38, 1173-1175 (2013)

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Fig. 1. Fig. 2. Fig. 3.

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