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Optics Letters

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  • Editor: Alan E. Willner
  • Vol. 38, Iss. 8 — Apr. 15, 2013
  • pp: 1224–1226

Sensitivity enhancement for evanescent-wave sensing using cavity-ring-down ellipsometry

Dimitris Sofikitis, Katerina Stamataki, Michael A. Everest, Vassilis Papadakis, Jean-Louis Stehle, Benoit Loppinet, and T. Peter Rakitzis  »View Author Affiliations


Optics Letters, Vol. 38, Issue 8, pp. 1224-1226 (2013)
http://dx.doi.org/10.1364/OL.38.001224


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Abstract

We demonstrate a method to increase the sensitivity of the s-p phase shift under total internal reflection (TIR) for optical sensing. This is achieved by the introduction of two simple dielectric layers to the TIR surface of a fused silica prism. The enhanced sensitivity is demonstrated using evanescent-wave cavity-ring-down-ellipsometry by measuring the refractive index of liquid mixtures and by studying the adsorption of polymers to the TIR surface of the fused silica prism.

© 2013 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(260.6970) Physical optics : Total internal reflection
(280.4788) Remote sensing and sensors : Optical sensing and sensors
(240.2130) Optics at surfaces : Ellipsometry and polarimetry

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: February 6, 2013
Revised Manuscript: March 5, 2013
Manuscript Accepted: March 7, 2013
Published: April 1, 2013

Citation
Dimitris Sofikitis, Katerina Stamataki, Michael A. Everest, Vassilis Papadakis, Jean-Louis Stehle, Benoit Loppinet, and T. Peter Rakitzis, "Sensitivity enhancement for evanescent-wave sensing using cavity-ring-down ellipsometry," Opt. Lett. 38, 1224-1226 (2013)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-38-8-1224


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References

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