In this Letter, we present a single-step method to simultaneously retrieve x-ray absorption and phase images valid for a broad range of imaging energies and material properties. Our method relies on the availability of spectrally resolved intensity measurements, which is now possible using semiconductor x-ray photon counting detectors. The retrieval method is derived and presented, with results showing good agreement.
© 2013 Optical Society of America
Original Manuscript: January 17, 2013
Revised Manuscript: March 17, 2013
Manuscript Accepted: March 19, 2013
Published: April 26, 2013
Doğa Gürsoy and Mini Das, "Single-step absorption and phase retrieval with polychromatic x rays using a spectral detector," Opt. Lett. 38, 1461-1463 (2013)