Abstract

We present a beam characterization system for infrared lasers which can measure both wavefront and beam profile with visible detectors. While previous studies demonstrated the conversion from the visible to the near infrared, this device exploits the wavelength conversion from the infrared to the visible, which is based on the refractive index change because of the optical switching of a vanadium dioxide layer. This technique can be applied over a broad spectral range from the visible to the infrared and potentially to the terahertz.

© 2013 Optical Society of America

Mid-IR to near-IR image conversion by thermally induced optical switching in vanadium dioxide

S. Bonora, U. Bortolozzo, S. Residori, R. Balu, and P. V. Ashrit
Opt. Lett. 35(2) 103-105 (2010)

Dynamic optical limiting experiments on vanadium dioxide and vanadium pentoxide thin films irradiated by a laser beam

Weiping Wang, Yongquan Luo, Dayong Zhang, and Fei Luo
Appl. Opt. 45(14) 3378-3381 (2006)

State conversion based on terahertz plasmonics with vanadium dioxide coating controlled by optical pumping

Fei Fan, Wen-Hao Gu, Sai Chen, Xiang-Hui Wang, and Sheng-Jiang Chang
Opt. Lett. 38(9) 1582-1584 (2013)

Vanadium-dioxide-assisted digital optical metasurfaces for dynamic wavefront engineering

Minseok Kim, Junho Jeong, Joyce K. S. Poon, and George V. Eleftheriades
J. Opt. Soc. Am. B 33(5) 980-988 (2016)

Optical properties of vanadium dioxide and vanadium pentoxide thin films

Elizabeth E. Chain
Appl. Opt. 30(19) 2782-2787 (1991)