We present a beam characterization system for infrared lasers which can measure both wavefront and beam profile with visible detectors. While previous studies demonstrated the conversion from the visible to the near infrared, this device exploits the wavelength conversion from the infrared to the visible, which is based on the refractive index change because of the optical switching of a vanadium dioxide layer. This technique can be applied over a broad spectral range from the visible to the infrared and potentially to the terahertz.
© 2013 Optical Society of America
Lasers and Laser Optics
Original Manuscript: December 18, 2012
Revised Manuscript: April 3, 2013
Manuscript Accepted: April 3, 2013
Published: April 30, 2013
S. Bonora, G. Beydaghyan, A. Haché, and P. V. Ashrit, "Mid-IR laser beam quality measurement through vanadium dioxide optical switching," Opt. Lett. 38, 1554-1556 (2013)