Abstract

We demonstrate the feasibility of measuring x-ray refractive indices by transparent edge diffraction without recourse to the Kramers–Kronig relations. The method requires a coherent x-ray source, a transparent sample with a straight edge, and a high resolution x-ray detector. Here, we use the aluminum ${\mathrm{K}}_{\alpha }$ radiation originating from a laser-produced plasma to coherently illuminate the edge of thin aluminum and beryllium foils. The resulting diffraction patterns are recorded with an x-ray CCD camera. From least-squares fits of Fresnel diffraction modeling to the measured data we determine the refractive index of Al and Be at the wavelength of the Al ${\mathrm{K}}_{\alpha }$ radiation (0.834 nm, 1.49 keV).

© 2013 Optical Society of America

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