OSA's Digital Library

Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 38, Iss. 9 — May. 1, 2013
  • pp: 1563–1565

Direct measurement of the x-ray refractive index by Fresnel diffraction at a transparent edge

C. W. Gayer, D. Hemmers, C. Stelzmann, and G. Pretzler  »View Author Affiliations


Optics Letters, Vol. 38, Issue 9, pp. 1563-1565 (2013)
http://dx.doi.org/10.1364/OL.38.001563


View Full Text Article

Enhanced HTML    Acrobat PDF (319 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

We demonstrate the feasibility of measuring x-ray refractive indices by transparent edge diffraction without recourse to the Kramers–Kronig relations. The method requires a coherent x-ray source, a transparent sample with a straight edge, and a high resolution x-ray detector. Here, we use the aluminum Kα radiation originating from a laser-produced plasma to coherently illuminate the edge of thin aluminum and beryllium foils. The resulting diffraction patterns are recorded with an x-ray CCD camera. From least-squares fits of Fresnel diffraction modeling to the measured data we determine the refractive index of Al and Be at the wavelength of the Al Kα radiation (0.834 nm, 1.49 keV).

© 2013 Optical Society of America

OCIS Codes
(050.1940) Diffraction and gratings : Diffraction
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(320.7090) Ultrafast optics : Ultrafast lasers
(340.0340) X-ray optics : X-ray optics

ToC Category:
X-ray Optics

History
Original Manuscript: January 25, 2013
Revised Manuscript: March 21, 2013
Manuscript Accepted: April 3, 2013
Published: April 30, 2013

Citation
C. W. Gayer, D. Hemmers, C. Stelzmann, and G. Pretzler, "Direct measurement of the x-ray refractive index by Fresnel diffraction at a transparent edge," Opt. Lett. 38, 1563-1565 (2013)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-38-9-1563


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. D. Attwood, Soft X-Rays and Extreme Ultraviolet Radiation (Cambridge, 2007).
  2. D. C. Creagh, in International Tables for Crystallography,3rd ed. (Kluwer, 2004), Vol. C, pp. 241–258.
  3. D. C. Creagh, Aust. J. Phys. 28, 543 (1975). [CrossRef]
  4. F. Stanglmeier, B. Lengeler, W. Weber, H. Göbel, and M. Schuster, Acta Crystallogr. Sect. A 48, 626 (1992). [CrossRef]
  5. M. Deutsch and M. Hart, Phys. Rev. B 30, 643 (1984). [CrossRef]
  6. W.-K. Lee, P. Cloetens, and M. Schlenker, Acta Crystallogr. Sect. A 60, 58 (2004). [CrossRef]
  7. D. Boschetto, G. Mourou, A. Rousse, A. Mordovanakis, B. Hou, J. Nees, D. Kumah, and R. Clarke, Appl. Phys. Lett. 90, 011106 (2007). [CrossRef]
  8. J. Komrska, Opt. Acta 14, 127 (1967). [CrossRef]
  9. M. T. Tavassoly, S. R. Hosseini, A. M. Fard, and R. R. Naraghi, Appl. Opt. 51, 7170 (2012). [CrossRef]
  10. E. M. Gullikson, Index of Refraction http://henke.lbl.gov/optical_constants/ .
  11. B. Henke, E. Gullikson, and J. Davis, At. Data Nucl. Data Tables 54, 181 (1993). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

Figures

Fig. 1. Fig. 2.
 

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited