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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 38, Iss. 9 — May. 1, 2013
  • pp: 1563–1565

Direct measurement of the x-ray refractive index by Fresnel diffraction at a transparent edge

C. W. Gayer, D. Hemmers, C. Stelzmann, and G. Pretzler  »View Author Affiliations

Optics Letters, Vol. 38, Issue 9, pp. 1563-1565 (2013)

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We demonstrate the feasibility of measuring x-ray refractive indices by transparent edge diffraction without recourse to the Kramers–Kronig relations. The method requires a coherent x-ray source, a transparent sample with a straight edge, and a high resolution x-ray detector. Here, we use the aluminum Kα radiation originating from a laser-produced plasma to coherently illuminate the edge of thin aluminum and beryllium foils. The resulting diffraction patterns are recorded with an x-ray CCD camera. From least-squares fits of Fresnel diffraction modeling to the measured data we determine the refractive index of Al and Be at the wavelength of the Al Kα radiation (0.834 nm, 1.49 keV).

© 2013 Optical Society of America

OCIS Codes
(050.1940) Diffraction and gratings : Diffraction
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(320.7090) Ultrafast optics : Ultrafast lasers
(340.0340) X-ray optics : X-ray optics

ToC Category:
X-ray Optics

Original Manuscript: January 25, 2013
Revised Manuscript: March 21, 2013
Manuscript Accepted: April 3, 2013
Published: April 30, 2013

C. W. Gayer, D. Hemmers, C. Stelzmann, and G. Pretzler, "Direct measurement of the x-ray refractive index by Fresnel diffraction at a transparent edge," Opt. Lett. 38, 1563-1565 (2013)

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Fig. 1. Fig. 2.

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