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Optics Letters

Optics Letters


  • Editor: Xi-Cheng Zhang
  • Vol. 39, Iss. 1 — Jan. 1, 2014
  • pp: 96–99

Random super-prism wavelength meter

Michael Mazilu, Tom Vettenburg, Andrea Di Falco, and Kishan Dholakia  »View Author Affiliations

Optics Letters, Vol. 39, Issue 1, pp. 96-99 (2014)

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The speckle pattern arising from a thin random, disordered scatterer may be used to detect the transversal mode of an incident beam. On the other hand, speckle patterns originating from meter-long multimode fibers can be used to detect different wavelengths. Combining these approaches, we develop a method that uses a thin random scattering medium to measure the wavelength of a near-infrared laser beam with picometer resolution. The method is based on the application of principal component analysis, which is used for pattern recognition and is applied here to the case of speckle pattern categorization.

© 2013 Optical Society of America

OCIS Codes
(030.6140) Coherence and statistical optics : Speckle
(070.4790) Fourier optics and signal processing : Spectrum analysis
(070.5010) Fourier optics and signal processing : Pattern recognition
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

ToC Category:
Fourier Optics and Signal Processing

Original Manuscript: August 26, 2013
Revised Manuscript: October 30, 2013
Manuscript Accepted: November 11, 2013
Published: December 20, 2013

Virtual Issues
Vol. 9, Iss. 3 Virtual Journal for Biomedical Optics

Michael Mazilu, Tom Vettenburg, Andrea Di Falco, and Kishan Dholakia, "Random super-prism wavelength meter," Opt. Lett. 39, 96-99 (2014)

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