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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Xi-Cheng Zhang
  • Vol. 39, Iss. 10 — May. 15, 2014
  • pp: 2908–2911

Dual-wavelength diffraction phase microscopy for simultaneous measurement of refractive index and thickness

Mohammad Reza Jafarfard, Sucbei Moon, Behnam Tayebi, and Dug Young Kim  »View Author Affiliations


Optics Letters, Vol. 39, Issue 10, pp. 2908-2911 (2014)
http://dx.doi.org/10.1364/OL.39.002908


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Abstract

We present a quantitative phase microscopy scheme that simultaneously acquires two phase images at different wavelengths. The simultaneous dual-wavelength measurement was performed with a diffraction phase microscope (DPM) based on a transmission grating and a spatial filter that form a common-path imaging interferometer. With a combined laser source that generates two-color light continuously, a different diffraction order of the grating was utilized for each wavelength component so that the dual-wavelength interference pattern could be distinguished by the distinct fringe frequencies. Our dual-wavelength phase imaging allowed us to extract information on the physical thickness and the refractive index for a specimen immersed in a highly dispersive surrounding medium. We found that our dual-wavelength DPM (DW-DPM) provides an accurate measurement of the volume and the refractive index of a microscopy sample with good measurement stability that results from the common-path geometry.

© 2014 Optical Society of America

OCIS Codes
(050.1950) Diffraction and gratings : Diffraction gratings
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(090.5694) Holography : Real-time holography

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: January 23, 2014
Revised Manuscript: April 9, 2014
Manuscript Accepted: April 9, 2014
Published: May 8, 2014

Virtual Issues
Vol. 9, Iss. 7 Virtual Journal for Biomedical Optics

Citation
Mohammad Reza Jafarfard, Sucbei Moon, Behnam Tayebi, and Dug Young Kim, "Dual-wavelength diffraction phase microscopy for simultaneous measurement of refractive index and thickness," Opt. Lett. 39, 2908-2911 (2014)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-39-10-2908

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