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Optics Letters

Optics Letters


  • Editor: Xi-Cheng Zhang
  • Vol. 39, Iss. 10 — May. 15, 2014
  • pp: 3030–3033

Subwavelength microwave electric-field imaging using Rydberg atoms inside atomic vapor cells

H. Q. Fan, S. Kumar, R. Daschner, H. Kübler, and J. P. Shaffer  »View Author Affiliations

Optics Letters, Vol. 39, Issue 10, pp. 3030-3033 (2014)

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We have recently shown [Nat. Phys. 8, 819 (2012)] that Alkali atoms contained in a vapor cell can serve as a highly accurate standard for microwave (MW) electric field strength as well as polarization. Here we show for the first time that Rydberg atom electromagnetically induced transparency can be used to image MW electric fields with unprecedented precision. The spatial resolution of the method is far into the subwavelength regime λ/650 or 66 μm at 6.9 GHz. The electric field resolutions are similar to those we have already demonstrated 50μVcm1. Our experimental results agree with finite element calculations of test electric-field patterns.

© 2014 Optical Society of America

OCIS Codes
(020.5780) Atomic and molecular physics : Rydberg states
(110.0110) Imaging systems : Imaging systems
(260.2110) Physical optics : Electromagnetic optics
(270.1670) Quantum optics : Coherent optical effects
(350.4010) Other areas of optics : Microwaves

ToC Category:
Atomic and Molecular Physics

Original Manuscript: March 13, 2014
Revised Manuscript: April 10, 2014
Manuscript Accepted: April 18, 2014
Published: May 14, 2014

H. Q. Fan, S. Kumar, R. Daschner, H. Kübler, and J. P. Shaffer, "Subwavelength microwave electric-field imaging using Rydberg atoms inside atomic vapor cells," Opt. Lett. 39, 3030-3033 (2014)

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