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Optics Letters

Optics Letters


  • Editor: Xi-Cheng Zhang
  • Vol. 39, Iss. 13 — Jul. 1, 2014
  • pp: 3853–3856

Stratified dispersive model for material characterization using terahertz time-domain spectroscopy

J. L. M. van Mechelen, A. B. Kuzmenko, and H. Merbold  »View Author Affiliations

Optics Letters, Vol. 39, Issue 13, pp. 3853-3856 (2014)

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We propose a novel terahertz material analysis approach that provides highly accurate material parameters and can be used for industrial quality control. The method treats the inspected material within its environment locally as a stratified system and describes the light–matter interaction of each layer in a realistic way. The approach is illustrated in the time-domain and frequency-domain for two potential fields of implementation of terahertz technology: quality control of (coated) paper sheets and car paint multilayers, both measured in humid air.

© 2014 Optical Society of America

OCIS Codes
(070.4790) Fourier optics and signal processing : Spectrum analysis
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.4825) Instrumentation, measurement, and metrology : Optical time domain reflectometry
(300.6495) Spectroscopy : Spectroscopy, teraherz

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: April 11, 2014
Revised Manuscript: May 18, 2014
Manuscript Accepted: May 19, 2014
Published: June 23, 2014

J. L. M. van Mechelen, A. B. Kuzmenko, and H. Merbold, "Stratified dispersive model for material characterization using terahertz time-domain spectroscopy," Opt. Lett. 39, 3853-3856 (2014)

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