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Optics Letters

Optics Letters


  • Editor: Xi-Cheng Zhang
  • Vol. 39, Iss. 16 — Aug. 15, 2014
  • pp: 4800–4803

Opto-mechanical probe for combining atomic force microscopy and optical near-field surface analysis

C. H. van Hoorn, D. C. Chavan, B. Tiribilli, G. Margheri, A. J. G. Mank, F. Ariese, and D. Iannuzzi  »View Author Affiliations

Optics Letters, Vol. 39, Issue 16, pp. 4800-4803 (2014)

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We have developed a new easy-to-use probe that can be used to combine atomic force microscopy (AFM) and scanning near-field optical microscopy (SNOM). We show that, using this device, the evanescent field, obtained by total internal reflection conditions in a prism, can be visualized by approaching the surface with the scanning tip. Furthermore, we were able to obtain simultaneous AFM and SNOM images of a standard test grating in air and in liquid. The lateral resolution in AFM and SNOM mode was estimated to be 45 and 160 nm, respectively. This new probe overcomes a number of limitations that commercial probes have, while yielding the same resolution.

© 2014 Optical Society of America

OCIS Codes
(060.2310) Fiber optics and optical communications : Fiber optics
(060.2370) Fiber optics and optical communications : Fiber optics sensors
(180.5810) Microscopy : Scanning microscopy
(180.4243) Microscopy : Near-field microscopy

ToC Category:

Original Manuscript: May 27, 2014
Revised Manuscript: July 5, 2014
Manuscript Accepted: July 5, 2014
Published: August 11, 2014

Virtual Issues
Vol. 9, Iss. 10 Virtual Journal for Biomedical Optics

C. H. van Hoorn, D. C. Chavan, B. Tiribilli, G. Margheri, A. J. G. Mank, F. Ariese, and D. Iannuzzi, "Opto-mechanical probe for combining atomic force microscopy and optical near-field surface analysis," Opt. Lett. 39, 4800-4803 (2014)

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