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Optics Letters

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  • Editor: Xi-Cheng Zhang
  • Vol. 39, Iss. 17 — Sep. 1, 2014
  • pp: 5196–5199

Subdiffraction-limited radius measurements of microcylinders using conventional bright-field optical microscopy

Douglas J. Little and Deborah M. Kane  »View Author Affiliations


Optics Letters, Vol. 39, Issue 17, pp. 5196-5199 (2014)
http://dx.doi.org/10.1364/OL.39.005196


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Abstract

A technique for measuring the radius of dielectric microcylinders with subdiffraction-limited precision is presented. Diffraction fringes arising from the dielectric cylinder are measured using conventional bright-field optical microscopy and compared with theory to deduce the radii. The technique has been demonstrated measuring the radii of the major-ampullate silks from Plebs eburnus spiders. Precision better than 50 nm is demonstrated, using a standard optical microscope with a numerical aperture of 0.6 for the objective. Accuracy was verified using scanning electron microscopy. This technique will facilitate rapid, precise measurement of dielectric microcylinder radii, enabling a new optical-microscopy-based measurement approach for these challenging micro-optics.

© 2014 Optical Society of America

OCIS Codes
(050.1940) Diffraction and gratings : Diffraction
(120.3940) Instrumentation, measurement, and metrology : Metrology
(160.1435) Materials : Biomaterials
(100.3200) Image processing : Inverse scattering
(240.3990) Optics at surfaces : Micro-optical devices

ToC Category:
Optical Devices

History
Original Manuscript: June 23, 2014
Revised Manuscript: July 28, 2014
Manuscript Accepted: July 29, 2014
Published: August 28, 2014

Citation
Douglas J. Little and Deborah M. Kane, "Subdiffraction-limited radius measurements of microcylinders using conventional bright-field optical microscopy," Opt. Lett. 39, 5196-5199 (2014)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-39-17-5196


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