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Optics Letters

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  • Editor: Xi-Cheng Zhang
  • Vol. 39, Iss. 3 — Feb. 1, 2014
  • pp: 489–492

Exciton photoluminescence in resonant quasi-periodic Thue–Morse quantum wells

W. J. Hsueh, C. H. Chang, and C. T. Lin  »View Author Affiliations


Optics Letters, Vol. 39, Issue 3, pp. 489-492 (2014)
http://dx.doi.org/10.1364/OL.39.000489


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Abstract

This Letter investigates exciton photoluminescence (PL) in resonant quasi-periodic Thue–Morse quantum wells (QWs). The results show that the PL properties of quasi-periodic Thue–Morse QWs are quite different from those of resonant Fibonacci QWs. The maximum and minimum PL intensities occur under the anti-Bragg and Bragg conditions, respectively. The maxima of the PL intensity gradually decline when the filling factor increases from 0.25 to 0.5. Accordingly, the squared electric field at the QWs decreases as the Thue–Morse QW deviates from the anti-Bragg condition.

© 2014 Optical Society of America

OCIS Codes
(230.5590) Optical devices : Quantum-well, -wire and -dot devices
(250.5230) Optoelectronics : Photoluminescence
(160.5293) Materials : Photonic bandgap materials

ToC Category:
Optoelectronics

History
Original Manuscript: November 15, 2013
Manuscript Accepted: December 15, 2013
Published: January 21, 2014

Citation
W. J. Hsueh, C. H. Chang, and C. T. Lin, "Exciton photoluminescence in resonant quasi-periodic Thue–Morse quantum wells," Opt. Lett. 39, 489-492 (2014)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-39-3-489

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