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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Xi-Cheng Zhang
  • Vol. 39, Iss. 3 — Feb. 1, 2014
  • pp: 711–714

Measurement and tuning of the chromatic dispersion of a silicon photonic wire around the half band gap spectral region

François Leo, Utsav Dave, Shahram Keyvaninia, Bart Kuyken, and Gunther Roelkens  »View Author Affiliations


Optics Letters, Vol. 39, Issue 3, pp. 711-714 (2014)
http://dx.doi.org/10.1364/OL.39.000711


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Abstract

We demonstrate the measurement and tuning of second-to-fourth order dispersion of a silicon wire waveguide in a spectral region of low nonlinear losses. Using white light interferometry we extract the chromatic dispersion of our waveguide from 1950 to 2300 nm. Moreover we demonstrate tuning of the zero dispersion wavelength over more than 100 nm, pushing it to longer wavelength by partially underetching the waveguide.

© 2014 Optical Society of America

OCIS Codes
(130.4310) Integrated optics : Nonlinear
(260.2030) Physical optics : Dispersion

ToC Category:
Physical Optics

History
Original Manuscript: October 24, 2013
Revised Manuscript: December 6, 2013
Manuscript Accepted: December 6, 2013
Published: January 31, 2014

Citation
François Leo, Utsav Dave, Shahram Keyvaninia, Bart Kuyken, and Gunther Roelkens, "Measurement and tuning of the chromatic dispersion of a silicon photonic wire around the half band gap spectral region," Opt. Lett. 39, 711-714 (2014)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-39-3-711

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