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Optics Letters

Optics Letters


  • Editor: Xi-Cheng Zhang
  • Vol. 39, Iss. 4 — Feb. 15, 2014
  • pp: 1011–1014

Retardance and flicker modeling and characterization of electro-optic linear retarders by averaged Stokes polarimetry

Francisco J. Martínez, Andrés Márquez, Sergi Gallego, Jorge Francés, Inmaculada Pascual, and Augusto Beléndez  »View Author Affiliations

Optics Letters, Vol. 39, Issue 4, pp. 1011-1014 (2014)

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A polarimetric method for the measurement of linear retardance in the presence of phase fluctuations is presented. This can be applied to electro-optic devices behaving as variable linear retarders. The method is based on an extended Mueller matrix model for the linear retarder containing the time-averaged effects of the instabilities. As a result, an averaged Stokes polarimetry technique is proposed to characterize both the retardance and its flicker magnitude. Predictive capability of the approach is experimentally demonstrated, validating the model and the calibration technique. The approach is applied to liquid crystal on silicon displays (LCoS) using a commercial Stokes polarimeter. Both the magnitude of the average retardance and the amplitude of its fluctuation are obtained for each gray level value addressed, thus enabling a complete phase characterization of the LCoS.

© 2014 Optical Society of America

OCIS Codes
(120.2040) Instrumentation, measurement, and metrology : Displays
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(230.2090) Optical devices : Electro-optical devices
(230.3720) Optical devices : Liquid-crystal devices
(230.6120) Optical devices : Spatial light modulators

ToC Category:
Optical Devices

Original Manuscript: October 16, 2013
Revised Manuscript: December 22, 2013
Manuscript Accepted: January 12, 2014
Published: February 12, 2014

Francisco J. Martínez, Andrés Márquez, Sergi Gallego, Jorge Francés, Inmaculada Pascual, and Augusto Beléndez, "Retardance and flicker modeling and characterization of electro-optic linear retarders by averaged Stokes polarimetry," Opt. Lett. 39, 1011-1014 (2014)

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