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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Xi-Cheng Zhang
  • Vol. 39, Iss. 4 — Feb. 15, 2014
  • pp: 869–872

Axial nanoscale localization by normalized total internal reflection fluorescence microscopy

Marcelina Cardoso Dos Santos, Régis Déturche, Cyrille Vézy, and Rodolphe Jaffiol  »View Author Affiliations


Optics Letters, Vol. 39, Issue 4, pp. 869-872 (2014)
http://dx.doi.org/10.1364/OL.39.000869


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Abstract

We present a simple modification of a standard total internal reflection fluorescence microscope to achieve nanometric axial resolution, typically 10nm. The technique is based on a normalization of total internal reflection images by conventional epi-illumination images. We demonstrate the potential of our method to study the adhesion of phopholipid giant unilamellar vesicles.

© 2014 Optical Society of America

OCIS Codes
(170.3010) Medical optics and biotechnology : Image reconstruction techniques
(180.0180) Microscopy : Microscopy
(180.2520) Microscopy : Fluorescence microscopy

ToC Category:
Microscopy

History
Original Manuscript: November 20, 2013
Revised Manuscript: December 12, 2013
Manuscript Accepted: December 30, 2013
Published: February 6, 2014

Virtual Issues
Vol. 9, Iss. 4 Virtual Journal for Biomedical Optics

Citation
Marcelina Cardoso Dos Santos, Régis Déturche, Cyrille Vézy, and Rodolphe Jaffiol, "Axial nanoscale localization by normalized total internal reflection fluorescence microscopy," Opt. Lett. 39, 869-872 (2014)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-39-4-869

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