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Optics Letters

Optics Letters


  • Editor: Xi-Cheng Zhang
  • Vol. 39, Iss. 7 — Apr. 1, 2014
  • pp: 1949–1952

Heterodyne displacement interferometer, insensitive for input polarization

Arjan J. H. Meskers, Jo W. Spronck, and Robert H. Munnig Schmidt  »View Author Affiliations

Optics Letters, Vol. 39, Issue 7, pp. 1949-1952 (2014)

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Periodic nonlinearity (PNL) in displacement interferometers is a systematic error source that limits measurement accuracy. The PNL of coaxial heterodyne interferometers is highly influenced by the polarization state and orientation of the source frequencies. In this Letter, we investigate this error source and discuss two interferometer designs, designed at TU Delft, that showed very low levels of PNL when subjected to any polarization state and/or polarization orientation. In the experiments, quarter-wave plates (qwps) and half-wave plates (hwps) were used to manipulate the polarization state and polarization orientation, respectively. Results from a commercial coaxial system showed first-order PNL exceeding 10 nm (together with higher order PNL) when the system ceased operation at around ±15°hwp rotation or ±20°qwp rotation. The two “Delft interferometers,” however, continued operation beyond these maxima and obtained first-order PNLs in the order of several picometers, without showing higher order PNLs. The major advantage of these interferometers, beside their high linearity, is that they can be fully fiber coupled and thus allow for a modular system buildup.

© 2014 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.4570) Instrumentation, measurement, and metrology : Optical design of instruments
(120.4820) Instrumentation, measurement, and metrology : Optical systems
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: February 3, 2014
Revised Manuscript: February 21, 2014
Manuscript Accepted: February 21, 2014
Published: March 24, 2014

Arjan J. H. Meskers, Jo W. Spronck, and Robert H. Munnig Schmidt, "Heterodyne displacement interferometer, insensitive for input polarization," Opt. Lett. 39, 1949-1952 (2014)

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  1. Th. Udem, R. Holzwarth, and T. W. Hansch, Nature 416, 233 (2002). [CrossRef]
  2. G. M. Harry, Class. Quantum Grav. 27, 084006 (2010). [CrossRef]
  3. C. Wagner and N. Harned, Nat. Photonics 4, 24 (2010). [CrossRef]
  4. A. J. H. Meskers, D. Voigt, and J. W. Spronck, Opt. Express 21, 17920 (2013). [CrossRef]
  5. S. J. A. G. Cosijns, H. Haitjema, and P. H. J. Schellekens, Precis. Eng. 26, 448 (2002). [CrossRef]
  6. G. Fedotova, Meas. Tech. 23, 577 (1980). [CrossRef]
  7. R. Quenelle, Hewlett Packard J. 34, 10 (1983).
  8. C. Sutton, J. Phys. E 20, 1290 (1987). [CrossRef]
  9. W. Hou and G. Wilkening, Precis. Eng. 14, 91 (1992). [CrossRef]
  10. C. Wu and R. D. Deslattes, Appl. Opt. 37, 6696 (1998). [CrossRef]
  11. W. Hou, Precis. Eng. 30, 337 (2006). [CrossRef]
  12. M. Tanaka, T. Yamagami, and K. Nakayama, IEEE Trans. Instrum. Meas. 38, 552 (1989). [CrossRef]
  13. C.-M. Wu and R. D. Deslattes, Appl. Opt. 38, 4089 (1999). [CrossRef]
  14. T. Schmitz and J. Beckwith, J. Mod. Opt. 49, 2105 (2002). [CrossRef]
  15. K.-N. Joo, J. D. Ellis, J. W. Spronck, P. J. M. van Kan, and R. H. M. Schmidt, Opt. Lett. 34, 386 (2009). [CrossRef]
  16. K.-N. Joo, J. D. Ellis, E. S. Buice, J. W. Spronck, and R. H. M. Schmidt, Opt. Express 18, 1159 (2010). [CrossRef]
  17. J. D. Ellis, A. J. H. Meskers, J. W. Spronck, and R. H. M. Schmidt, Opt. Lett. 36, 3584 (2011). [CrossRef]
  18. C. Weichert, P. Kochert, R. Koning, J. Flugge, B. Andreas, U. Kuetgens, and A. Yacoot, Meas. Sci. Technol. 23, 094005 (2012). [CrossRef]
  19. J. Lawall and E. Kessler, Rev. Sci. Instrum. 71, 2669 (2000). [CrossRef]
  20. Spatial heterodyne frequency generation Delft system: Thorlabs stabilized He–Ne laser HRS015, ISOMET acousto-optic modulators OAM 1141-T40-2 and drivers 531C-L (39 and 41 MHz), and phase measurement readout according to Agilent Technologies phase measurement board N1225A.
  21. Agilent Technologies interferometer E1826G (optical resolution of 4), Zeeman laser source 5517D, and phase measurement board N1225A.
  22. V. G. Badami and S. R. Paterson, Precis. Eng. 24, 41 (2000). [CrossRef]
  23. T. L. Schmitz, D. Chu, and L. Houck, Meas. Sci. Technol. 17, 3195 (2006). [CrossRef]
  24. C. Schluchter, V. Ganguly, D. Chu, and T. L. Schmitz, Precis. Eng. 35, 241 (2011). [CrossRef]
  25. Capacitive probe 2805MSE A9089 and electronic readout using MicroSense, LLC, model 4810.
  26. C.-M. Wu, Opt. Commun. 215, 17 (2003). [CrossRef]

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