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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Xi-Cheng Zhang
  • Vol. 39, Iss. 7 — Apr. 1, 2014
  • pp: 1996–1999

Quantitative phase microscopy with off-axis optical coherence tomography

Matthew T. Rinehart, Volker Jaedicke, and Adam Wax  »View Author Affiliations


Optics Letters, Vol. 39, Issue 7, pp. 1996-1999 (2014)
http://dx.doi.org/10.1364/OL.39.001996


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Abstract

We have developed a modality for quantitative phase imaging within spectral domain optical coherence tomography based on using an off-axis reference beam. By tilting the propagation of the reference beam relative to that of the sample beam, a spatially varying fringe is generated. Upon detection of this fringe using a parallel spectral domain scheme, the fringe can be used to separate the interference component of the signal and obtain the complex sample field. In addition to providing quantitative phase measurements within a depth resolved measurement, this approach also allows elimination of the complex conjugate artifact, a known limitation of spectral interferometry. The principle of the approach is described here along with demonstration of its capabilities using technical samples.

© 2014 Optical Society of America

OCIS Codes
(070.6110) Fourier optics and signal processing : Spatial filtering
(110.4500) Imaging systems : Optical coherence tomography
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2880) Instrumentation, measurement, and metrology : Holographic interferometry

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: January 31, 2014
Revised Manuscript: February 28, 2014
Manuscript Accepted: February 28, 2014
Published: March 25, 2014

Virtual Issues
Vol. 9, Iss. 6 Virtual Journal for Biomedical Optics

Citation
Matthew T. Rinehart, Volker Jaedicke, and Adam Wax, "Quantitative phase microscopy with off-axis optical coherence tomography," Opt. Lett. 39, 1996-1999 (2014)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-39-7-1996

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