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Optics Letters

Optics Letters


  • Editor: Xi-Cheng Zhang
  • Vol. 39, Iss. 8 — Apr. 15, 2014
  • pp: 2518–2521

Fast optimization of a bimorph mirror using x-ray grating interferometry

Hongchang Wang, Kawal Sawhney, Sebastien Berujon, John Sutter, Simon G. Alcock, Ulrich Wagner, and Christoph Rau  »View Author Affiliations

Optics Letters, Vol. 39, Issue 8, pp. 2518-2521 (2014)

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An x-ray grating interferometer was employed for in situ optimization of an x-ray bimorph mirror. Unlike many other at-wavelength techniques, only a single interferogram image, captured out of the focal plane, is required, enabling the optical surface to be quickly optimized. Moiré fringe analysis was used to calculate the wavefront slope error, which is proportional to the mirror’s slope error. Using feedback from grating interferometry, the slope error of a bimorph mirror was reduced to <200nrad (rms) in only two iterations. This technique has the potential to create photon beams with spatially homogeneous intensities for use in synchrotron and free electron laser beam lines.

© 2014 Optical Society of America

OCIS Codes
(050.2770) Diffraction and gratings : Gratings
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(340.7450) X-ray optics : X-ray interferometry

ToC Category:
Imaging Systems

Original Manuscript: December 18, 2013
Revised Manuscript: March 17, 2014
Manuscript Accepted: March 18, 2014
Published: April 15, 2014

Hongchang Wang, Kawal Sawhney, Sebastien Berujon, John Sutter, Simon G. Alcock, Ulrich Wagner, and Christoph Rau, "Fast optimization of a bimorph mirror using x-ray grating interferometry," Opt. Lett. 39, 2518-2521 (2014)

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