Abstract

We use symmetry considerations to understand and unravel near-field measurements, ultimately showing that we can spatially map three distinct fields using only two detectors. As an example, we create 2D field maps of the out-of-plane magnetic field and two in-plane fields for a silicon ridge waveguide. Furthermore, we are able to identify and remove polarization mixing of less than $1/30$ of our experimental signals. Since symmetries are prevalent in nanophotonic structures and their near-fields, our method can have an impact on many future near-field measurements.

© 2014 Optical Society of America

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