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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 5, Iss. 9 — Sep. 1, 1980
  • pp: 377–379

Sensitive photothermal deflection technique for measuring absorption in optically thin media

A. C. Boccara, D. Fournier, Warren Jackson, and Nabil M. Amer  »View Author Affiliations


Optics Letters, Vol. 5, Issue 9, pp. 377-379 (1980)
http://dx.doi.org/10.1364/OL.5.000377


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Abstract

A highly sensitive and simple photothermal scheme for determining optical absorptions in condensed-matter samples is presented. αl values as low as 10−7 and 10−8 were measured for thin films and coatings and for liquids, respectively. A comparison with the thermal lens effect is given, and the experimental factors limiting our sensitivity are discussed.

© 1980 Optical Society of America

History
Original Manuscript: April 14, 1980
Published: September 1, 1980

Citation
A. C. Boccara, Warren Jackson, Nabil M. Amer, and D. Fournier, "Sensitive photothermal deflection technique for measuring absorption in optically thin media," Opt. Lett. 5, 377-379 (1980)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-5-9-377

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