A highly sensitive and simple photothermal scheme for determining optical absorptions in condensed-matter samples is presented. αl values as low as 10−7 and 10−8 were measured for thin films and coatings and for liquids, respectively. A comparison with the thermal lens effect is given, and the experimental factors limiting our sensitivity are discussed.
© 1980 Optical Society of America
Original Manuscript: April 14, 1980
Published: September 1, 1980
A. C. Boccara, Warren Jackson, Nabil M. Amer, and D. Fournier, "Sensitive photothermal deflection technique for measuring absorption in optically thin media," Opt. Lett. 5, 377-379 (1980)