Relationship between surface-enhanced Raman scattering and the dielectric properties of aggregated silver films
Optics Letters, Vol. 6, Issue 1, pp. 33-35 (1981)
http://dx.doi.org/10.1364/OL.6.000033
Acrobat PDF (428 KB)
Abstract
By using an evaporated silver film that has a continuously varying thickness, we have demonstrated the dependence of surface-enhanced Raman scattering (SERS) on the dielectric properties of the film. These results support local field models that are based on metal-particle resonances for SERS.
© 1981 Optical Society of America
Citation
J. G. Bergman, D. S. Chemla, P. F. Liao, A. M. Glass, A. Pinczuk, R. M. Hart, and D. H. Olson, "Relationship between surface-enhanced Raman scattering and the dielectric properties of aggregated silver films," Opt. Lett. 6, 33-35 (1981)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-6-1-33
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
« Previous Article | Next Article »
OSA is a member of 