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Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 6, Iss. 1 — Jan. 1, 1981
  • pp: 33–35

Relationship between surface-enhanced Raman scattering and the dielectric properties of aggregated silver films

J. G. Bergman, D. S. Chemla, P. F. Liao, A. M. Glass, A. Pinczuk, R. M. Hart, and D. H. Olson  »View Author Affiliations


Optics Letters, Vol. 6, Issue 1, pp. 33-35 (1981)
http://dx.doi.org/10.1364/OL.6.000033


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Abstract

By using an evaporated silver film that has a continuously varying thickness, we have demonstrated the dependence of surface-enhanced Raman scattering (SERS) on the dielectric properties of the film. These results support local field models that are based on metal-particle resonances for SERS.

© 1981 Optical Society of America

History
Original Manuscript: September 29, 1980
Revised Manuscript: October 28, 1980
Published: January 1, 1981

Citation
J. G. Bergman, D. S. Chemla, P. F. Liao, A. M. Glass, A. Pinczuk, R. M. Hart, and D. H. Olson, "Relationship between surface-enhanced Raman scattering and the dielectric properties of aggregated silver films," Opt. Lett. 6, 33-35 (1981)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-6-1-33


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