By using an evaporated silver film that has a continuously varying thickness, we have demonstrated the dependence of surface-enhanced Raman scattering (SERS) on the dielectric properties of the film. These results support local field models that are based on metal-particle resonances for SERS.
© 1981 Optical Society of America
Original Manuscript: September 29, 1980
Revised Manuscript: October 28, 1980
Published: January 1, 1981
J. G. Bergman, D. S. Chemla, P. F. Liao, A. M. Glass, A. Pinczuk, R. M. Hart, and D. H. Olson, "Relationship between surface-enhanced Raman scattering and the dielectric properties of aggregated silver films," Opt. Lett. 6, 33-35 (1981)