An optical technique is described for detecting and measuring thicknesses of adsorbed films with subangstrom sensitivity. The technique relies on optical interference from an antireflecting thin-film structure that is predeposited on a transparent cell window: the reflectivity of the window depends linearly on the thickness of the molecular layer adsorbed from the gas in the cell.
© 1981 Optical Society of America
Original Manuscript: June 11, 1981
Revised Manuscript: August 10, 1981
Published: November 1, 1981
V. Daneu, R. M. Osgood, and D. J. Ehrlich, "Optical reflectance technique for observations of submonolayer adsorbed films," Opt. Lett. 6, 563-565 (1981)