A simple technique for in situ measurements of pulsed Gaussian-beam spot sizes is reported. This technique is particularly useful for measurements on highly focused beam spots. It can also be used for absolute calibration of the threshold-energy fluences for pulsed-laser-induced effects. The thresholds for several effects in picosecond-laser-induced phase transformation on silicon-crystal surfaces are calibrated with this technique.
© 1982 Optical Society of America
Original Manuscript: December 21, 1981
Published: May 1, 1982
J. M. Liu, "Simple technique for measurements of pulsed Gaussian-beam spot sizes," Opt. Lett. 7, 196-198 (1982)