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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 7, Iss. 5 — May. 1, 1982
  • pp: 196–198

Simple technique for measurements of pulsed Gaussian-beam spot sizes

J. M. Liu  »View Author Affiliations


Optics Letters, Vol. 7, Issue 5, pp. 196-198 (1982)
http://dx.doi.org/10.1364/OL.7.000196


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Abstract

A simple technique for in situ measurements of pulsed Gaussian-beam spot sizes is reported. This technique is particularly useful for measurements on highly focused beam spots. It can also be used for absolute calibration of the threshold-energy fluences for pulsed-laser-induced effects. The thresholds for several effects in picosecond-laser-induced phase transformation on silicon-crystal surfaces are calibrated with this technique.

© 1982 Optical Society of America

History
Original Manuscript: December 21, 1981
Published: May 1, 1982

Citation
J. M. Liu, "Simple technique for measurements of pulsed Gaussian-beam spot sizes," Opt. Lett. 7, 196-198 (1982)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-7-5-196


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References

  1. For example, a multilens camera technique: I. M. Winer, “A self-calibrating technique measuring laser beam intensity distributions,” Appl. Opt. 5, 1437 (1966). [CrossRef] [PubMed]
  2. See, for example, A Yariv, Quantum Electronics, 2nd ed. (Wiley, New York, 1975), pp. 110–117.
  3. J. M. Liu, R. Yen, H. Kurz, N. Bloembergen, “Phase transformation on and charged particle emission from a silicon crystal surface, induced by picosecond laser pulses,” Appl. Phys. Lett. 39, 755 (1981). Photographs of the amorphous ring patterns can be found in this reference. [CrossRef]

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