Abstract

The problem of in-plane scattering in a planar optical waveguide has been analyzed by means of a Green’s function technique. The main result is applicable to scattering caused by either surface roughness or refractive-index fluctuations. As a specific example, the theory is applied to the case of surface roughness to calculate the scattered power collected by an off-axis detector.

© 1984 Optical Society of America

In-plane scattering in planar optical waveguides: refractive-index fluctuations and surface roughness

D. G. Hall
J. Opt. Soc. Am. A 2(5) 747-752 (1985)

Quasi-optics of scattering and absorption in planar waveguides

Marek T. Wlodarczyk
J. Opt. Soc. Am. A 5(3) 387-396 (1988)

Comparison of two approaches to the waveguide scattering problem: TM polarization

R. W. Gruhike and D. G. Hall
Appl. Opt. 23(1) 127-133 (1984)

Out-of-plane scattering from glass waveguides: comparison of theory and experiment

Eric Bradley and D. G. Hall
Opt. Lett. 7(5) 235-237 (1982)

In-plane scattering measurements in a planar optical waveguide by an integrated technique

F. K. Hopkins, Howard E. Jackson, and J. T. Boyd
Appl. Opt. 20(16) 2761_1-2763 (1981)