Effects of coherence and vector properties of the light on the resolution limit in stimulated emission depletion fluorescence microscopy

• Abstract

• JOSA A, Vol. 25, Issue 6, pp. 1378-1382 (June 2008)
• Wanrong Gao

Monte Carlo modeling of spatial coherence: free-space diffraction

• Abstract

• JOSA A, Vol. 25, Issue 10, pp. 2571-2581 (October 2008)
• David G. Fischer, Scott A. Prahl, Donald D. Duncan

Binary mask optimization for inverse lithography with partially coherent illumination

• Abstract

• JOSA A, Vol. 25, Issue 12, pp. 2960-2970 (December 2008)
• Xu Ma, Gonzalo Arce

Computation theory of partially coherent imaging by stacked pupil shift matrix

• Abstract

• JOSA A, Vol. 25, Issue 12, pp. 3111-3119 (December 2008)
• Kenji Yamazoe

Monte Carlo Green's function formalism for the propagation of partially coherent light

• Abstract

• JOSA A, Vol. 26, Issue 7, pp. 1533-1543 (July 2009)
• Scott A. Prahl, David G. Fischer, Donald D. Duncan

Elementary functions: propagation of partially coherent light

• Abstract

• JOSA A, Vol. 26, Issue 7, pp. 1721-1729 (July 2009)
• Anna Burvall, Arlene Smith, Christopher Dainty

Optimal signal-to-noise ratios for soft x-ray lensless imaging

• Abstract

• Optics Letters, Vol. 34, Issue 5, pp. 650-652 (March 2009)
• R. Rick, A. Scherz, W. F. Schlotter, D. Zhu, J. Lüning, J. Stöhr

Quantitative phase-gradient imaging at high resolution with asymmetric illumination-based differential phase contrast

• Abstract

• Optics Letters, Vol. 34, Issue 13, pp. 1924-1926 (July 2009)
• Shalin B. Mehta, Colin J. R. Sheppard

Virtual pinhole-scanning spectroscopic imaging platform using low-coherence enhanced backscattering

• Abstract

• Optics Letters, Vol. 34, Issue 16, pp. 2387-2389 (August 2009)
• Jingjing Liu, Zhengbin Xu, Young L. Kim

Phase-space representation of partially coherent imaging systems using the Cohen class distribution

• Abstract
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• Optics Letters, Vol. 35, Issue 3, pp. 348-350 (February 2010)
• Shalin B. Mehta, Colin J. R. Sheppard

Phase-contrast imaging using a scanning-doublegrating configuration

• Abstract
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• Optics Express, Vol. 16, Issue 8, pp. 5849-5867 (April 2008)
• Ya. I. Nesterets, S. W. Wilkins

PSM design for inverse lithography with partially coherent illumination

• Abstract
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• Optics Express, Vol. 16, Issue 24, pp. 20126-20141 (November 2008)
• Xu Ma, Gonzalo R. Arce

Partially correlated azimuthal vortex illumination: Coherence and correlation measurements and effects in imaging

• Abstract
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• Optics Express, Vol. 16, Issue 25, pp. 20418-20426 (December 2008)
• Dean P. Brown, Thomas G. Brown

Imaging through turbid media based on wave transport model approach

• Abstract
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• Optics Express, Vol. 16, Issue 26, pp. 21389-21400 (December 2008)
• C. K. Aruldoss, A. Roberts

Pixel-based simultaneous source and mask optimization for resolution enhancement in optical lithography

• Abstract
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• Optics Express, Vol. 17, Issue 7, pp. 5783-5793 (March 2009)
• Xu Ma, Gonzalo R. Arce

Aerial image based technique for measurement of lens aberrations up to 37th Zernike coefficient in lithographic tools under partial coherent illumination

• Abstract
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• Optics Express, Vol. 17, Issue 21, pp. 19278-19291 (October 2009)
• Wei Liu, Shiyuan Liu, Tingting Zhou, Lijuan Wang

On-axis probability density function and fade behavior of partially coherent beams propagating through turbulence

• Abstract

• Applied Optics, Vol. 48, Issue 2, pp. 167-175 (January 2009)
• Xifeng Xiao, David Voelz

Coma measurement by use of an alternating phase-shifting mask mark with a specific phase width

• Abstract

• Applied Optics, Vol. 48, Issue 2, pp. 261-269 (January 2009)
• Zicheng Qiu, Xiangzhao Wang, Qiongyan Yuan, Fan Wang

Fast computation of constructive and destructive interference areas in partially coherent imaging for resolution enhancement in optical microlithography

• Abstract

• Applied Optics, Vol. 48, Issue 8, pp. 1419-1424 (March 2009)
• Kenji Yamazoe, Yoshiyuki Sekine, Tokuyuki Honda

Translational-symmetry alternating phase shifting mask grating mark used in a linear measurement model of lithographic projection lens aberrations

• Abstract

• Applied Optics, Vol. 48, Issue 19, pp. 3654-3663 (July 2009)
• Zicheng Qiu, Xiangzhao Wang, Qunyu Bi, Qiongyan Yuan, Bo Peng, Lifeng Duan