Understanding the twin-image problem in phase retrieval

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• JOSA A, Vol. 29, Issue 11, pp. 2367-2375 (November 2012)
• Manuel Guizar-Sicairos, James R. Fienup

Postprocessing method for reducing phase effects in reconstructed microcomputed-tomography data

• Abstract

• JOSA A, Vol. 30, Issue 3, pp. 455-461 (March 2013)
• Erik L. G. Wernersson, Matthieu N. Boone, Jan Van den Bulcke, Luc Van Hoorebeke, Cris L. Luengo Hendriks

Hard x-ray phase contrast imaging using a tabletop Talbot–Lau interferometer with multiline embedded x-ray targets

• Abstract

• Optics Letters, Vol. 38, Issue 2, pp. 157-159 (January 2013)
• Takayoshi Shimura, Naoki Morimoto, Sho Fujino, Takaharu Nagatomi, Keni-chi Oshima, Jimpei Harada, Kazuhiko Omote, Naohisa Osaka, Takuji Hosoi, Heiji Watanabe

Approach for differential phase contrast imaging in x-ray microscopy

• Abstract

• Optics Letters, Vol. 38, Issue 11, pp. 1990-1992 (June 2013)
• Zhenwei Liu, Danying Lin, Jianheng Huang, Hanben Niu

A generalization for optimized phase retrieval algorithms

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• Optics Express, Vol. 20, Issue 22, pp. 24778-24790 (October 2012)
• Daniel E. Adams, Leigh S. Martin, Matthew D. Seaberg, Dennis F. Gardner, Henry C. Kapteyn, Margaret M. Murnane

A scheme for lensless X-ray microscopy combining coherent diffraction imaging and differential corner holography

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• Optics Express, Vol. 20, Issue 22, pp. 25152-25160 (October 2012)
• F. Capotondi, E. Pedersoli, M. Kiskinova, A.V. Martin, M. Barthelmess, H. N. Chapman

Differential near-edge coherent diffractive imaging using a femtosecond high-harmonic XUV light source

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• Optics Express, Vol. 20, Issue 24, pp. 26167-26175 (November 2012)
• Fabian Weise, Daniel M. Neumark, Stephen R. Leone, Oliver Gessner

Analytical and experimental determination of signal-to-noise ratio and figure of merit in three phase-contrast imaging techniques

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• Optics Express, Vol. 20, Issue 25, pp. 27670-27690 (December 2012)
• P.C. Diemoz, A. Bravin, M. Langer, P. Coan

When holography meets coherent diffraction imaging

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• Optics Express, Vol. 20, Issue 27, pp. 28871-28892 (December 2012)
• Tatiana Latychevskaia, Jean-Nicolas Longchamp, Hans-Werner Fink

A quantitative, non-interferometric X-ray phase contrast imaging technique

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• Optics Express, Vol. 21, Issue 1, pp. 647-661 (January 2013)
• Peter R.T. Munro, Luigi Rigon, Konstantin Ignatyev, Frances C.M. Lopez, Diego Dreossi, Robert D. Speller, Alessandro Olivo

Phase retrieval in in-line x-ray phase contrast imaging based on total variation minimization

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• Optics Express, Vol. 21, Issue 1, pp. 710-723 (January 2013)
• Alexander Kostenko, K. Joost Batenburg, Heikki Suhonen, S. Erik Offerman, Lucas J. van Vliet

Quantitative X-ray phase-contrast computed tomography at 82 keV

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• Optics Express, Vol. 21, Issue 4, pp. 4155-4166 (February 2013)
• Marian Willner, Martin Bech, Julia Herzen, Irene Zanette, Dieter Hahn, Johannes Kenntner, Juergen Mohr, Alexander Rack, Timm Weitkamp, Franz Pfeiffer

Comparison of single distance phase retrieval algorithms by considering different object composition and the effect of statistical and structural noise

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• Optics Express, Vol. 21, Issue 6, pp. 7384-7399 (March 2013)
• R. C. Chen, L. Rigon, R. Longo

Tabletop single-shot extreme ultraviolet Fourier transform holography of an extended object

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• Optics Express, Vol. 21, Issue 8, pp. 9959-9966 (April 2013)
• Erik B. Malm, Nils C. Monserud, Christopher G. Brown, Przemyslaw W. Wachulak, Huiwen Xu, Ganesh Balakrishnan, Weilun Chao, Erik Anderson, Mario C. Marconi

A simplified approach to quantitative coded aperture X-ray phase imaging

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• Optics Express, Vol. 21, Issue 9, pp. 11187-11201 (May 2013)
• Peter R.T. Munro, Charlotte K. Hagen, Magdalena B. Szafraniec, Alessandro Olivo

Total variation minimization approach in in-line x-ray phase-contrast tomography

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• Optics Express, Vol. 21, Issue 10, pp. 12185-12196 (May 2013)
• Alexander Kostenko, K. Joost Batenburg, Andrew King, S. Erik Offerman, Lucas J. van Vliet

Sensing the wavefront of x-ray free-electron lasers using aerosol spheres

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• Optics Express, Vol. 21, Issue 10, pp. 12385-12394 (May 2013)
• N. Duane Loh, Dmitri Starodub, Lukas Lomb, Christina Y. Hampton, Andrew V. Martin, Raymond G. Sierra, Anton Barty, Andrew Aquila, Joachim Schulz, Jan Steinbrener, Robert L. Shoeman, Stephan Kassemeyer, Christoph Bostedt, John Bozek, Sascha W. Epp, Benjamin Erk, Robert Hartmann, Daniel Rolles, Artem Rudenko, Benedikt Rudek, Lutz Foucar, Nils Kimmel, Georg Weidenspointner, Guenter Hauser, Peter Holl, Emanuele Pedersoli, Mengning Liang, Mark S. Hunter, Lars Gumprecht, Nicola Coppola, Cornelia Wunderer, Heinz Graafsma, Filipe R.N.C. Maia, Tomas Ekeberg, Max Hantke, Holger Fleckenstein, Helmut Hirsemann, Karol Nass, Thomas A. White, Herbert J. Tobias, George R. Farquar, W. Henry Benner, Stefan Hau-Riege, Christian Reich, Andreas Hartmann, Heike Soltau, Stefano Marchesini, Sasa Bajt, Miriam Barthelmess, Lothar Strueder, Joachim Ullrich, Philip Bucksbaum, Matthias Frank, Ilme Schlichting, Henry N. Chapman, Michael J. Bogan

The extraction of single-particle diffraction patterns from a multiple-particle diffraction pattern

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• Optics Express, Vol. 21, Issue 13, pp. 15102-15112 (July 2013)
• A.V. Martin, A.J. Morgan, T. Ekeberg, N.D. Loh, F.R.N.C. Maia, F. Wang, J.C.H. Spence, H.N. Chapman

Soft x-ray free-electron laser imaging by LiF crystal and film detectors over a wide range of fluences

• Abstract

• Applied Optics, Vol. 52, Issue 3, pp. 509-515 (January 2013)
• Tatiana A. Pikuz, Anatoly Ya. Faenov, Yuji Fukuda, Masaki Kando, Paul Bolton, Alexander Mitrofanov, Alexander V. Vinogradov, Mitsuru Nagasono, Haruhiko Ohashi, Makina Yabashi, Kensuke Tono, Yasunori Senba, Tadashi Togashi, Tetsuya Ishikawa

Nonlinear approaches for the single-distance phase retrieval problem involving regularizations with sparsity constraints

• Abstract

• Applied Optics, Vol. 52, Issue 17, pp. 3977-3986 (June 2013)
• Valentina Davidoiu, Bruno Sixou, Max Langer, Francoise Peyrin