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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

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Instrumentation, measurement, and metrology : Ellipsometry and polarimetry


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  • JOSA A, Vol. 31, Issue 5, pp. 1013-1022 (May 2014)
  • Andrey S. Alenin, J. Scott Tyo

  • JOSA B, Vol. 31, Issue 9, pp. 2083-2083 (September 2014)
  • Huai-Yi Xie, Yia-Chung Chang

  • Optics Letters, Vol. 39, Issue 9, pp. 2656-2659 (May 2014)
  • Jintao Chang, Nan Zeng, Honghui He, Yonghong He, Hui Ma

  • Optics Letters, Vol. 39, Issue 11, pp. 3086-3089 (June 2014)
  • R. Ramaseshan, S. Tripura Sundari, A. K. Balamurugan, Sitaram Dash, A. K. Tyagi, Y. Sato, T. Nakayama, H. Suematsu

  • Optics Express, Vol. 22, Issue 9, pp. 11011-11020 (May 2014)
  • Wenjia Yuan, Weidong Shen, Yueguang Zhang, Xu Liu

  • Optics Express, Vol. 22, Issue 10, pp. 11869-11883 (May 2014)
  • Hu Dai, Changxiang Yan

  • Optics Express, Vol. 22, Issue 12, pp. 15165-15177 (June 2014)
  • Xiuguo Chen, Shiyuan Liu, Chuanwei Zhang, Hao Jiang, Zhichao Ma, Tangyou Sun, Zhimou Xu

  • Optics Express, Vol. 22, Issue 14, pp. 17430-17439 (July 2014)
  • Daesuk Kim, Yoonho Seo, Moonseob Jin, Yonghee Yoon, Won Chegal, Yong Jae Cho, Hyun Mo Cho, Dahi G. Abdelsalam, Robert Magnusson

  • Optics Express, Vol. 22, Issue 18, pp. 21427-21440 (September 2014)
  • Ayman Ghabbach, Myriam Zerrad, Gabriel Soriano, Simona Liukaityte, Claude Amra

  • Optics Express, Vol. 22, Issue 18, pp. 22031-22042 (September 2014)
  • Jinlong Zhu, Shiyuan Liu, Xiuguo Chen, Chuanwei Zhang, Hao Jiang

  • Optics Express, Vol. 22, Issue 22, pp. 26967-26975 (November 2014)
  • R. Boge, S. Heuser, M. Sabbar, M. Lucchini, L. Gallmann, C. Cirelli, U. Keller

  • Applied Optics, Vol. 53, Issue 10, pp. 1994-2000 (April 2014)
  • Gopika K. P. Ramanandan, Aurèle J. L. Adam, Gopakumar Ramakrishnan, Peter Petrik, Ruud Hendrikx, Paul C. M. Planken

  • Applied Optics, Vol. 53, Issue 10, pp. 2236-2245 (April 2014)
  • Oriol Arteaga, Marta Baldrís, Joan Antó, Adolf Canillas, Esther Pascual, Enric Bertran

  • Applied Optics, Vol. 53, Issue 22, pp. 4930-4938 (August 2014)
  • Corey Stambaugh, Mathieu Durand, Utku Kemiktarak, John Lawall

  • Applied Optics, Vol. 53, Issue 29, pp. 6706-6712 (October 2014)
  • Patrick Terrier, Jean Michel Charbois, Vincent Devlaminck

  • Applied Optics, Vol. 53, Issue 30, pp. 7081-7086 (October 2014)
  • Shuchun Huo, Chunguang Hu, Yanning Li, Xiaotang Hu

  • Journal of the Optical Society of Korea, Vol. 18, Issue 2, pp. 156-161 (April 2014)
  • Kyung Hun Lyum, Hee Kyu Yoon, Sang Jun Kim, Sung Hyuck An, Sang Youl Kim

  • Journal of the Optical Society of Korea, Vol. 18, Issue 4, pp. 350-358 (September 2014)
  • Soon Yong Hwang, Tae Jung Kim, Jun Seok Byun, Han Gyeol Park, Junho Choi, Yu Ri Kang, Jae Chan Park, Young Dong Kim

  • Journal of the Optical Society of Korea, Vol. 18, Issue 4, pp. 359-364 (September 2014)
  • Tae Jung Kim, Jun Seok Byun, Nilesh Barange, Han Gyeol Park, Yu Ri Kang, Jae Chan Park, Young Dong Kim

  • Optical Materials Express, Vol. 4, Issue 9, pp. 1903-1919 (September 2014)
  • L. Halagačka, K. Postava, M. Vanwolleghem, F. Vaurette, J. Ben Youssef, B. Dagens, J. Pištora
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