Determination of height distribution on a rough interface by measuring the coherently transmitted or reflected light intensity

• Abstract

• JOSA A, Vol. 25, Issue 10, pp. 2509-2517 (October 2008)
• Masoomeh Dashtdar, M. Taghi Tavassoly

Characterization of high-Q optical microcavities using confocal microscopy

• Abstract

• Optics Letters, Vol. 33, Issue 24, pp. 2931-2933 (December 2008)
• Rajan P. Kulkarni, Scott E. Fraser, Andrea M. Armani

Impact of surface roughness on laser surface authentication signatures under linear and rotational displacements

• Abstract

• Optics Letters, Vol. 34, Issue 20, pp. 3175-3177 (October 2009)
• Peter R. Seem, James D. Buchanan, Russell P. Cowburn

Wide-field optical nanoprofilometry using structured illumination

• Abstract

• Optics Letters, Vol. 34, Issue 22, pp. 3538-3540 (November 2009)
• Chun-Chieh Wang, Kuang-Li Lee, Chau-Hwang Lee

Sensing of human plasma fibrinogen on polished, chemically etched and carbon treated titanium surfaces by diffractive optical element based sensor

• Abstract
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• Optics Express, Vol. 16, Issue 14, pp. 10130-10140 (July 2008)
• Raimo Silvennoinen, Vladimir Vetterl, Stanislav Hason, Heikki Tuononen, Martti Silvennoinen, Kari Myller, Ladislav Cvrcek, Jiri Vanek, Patrik Prachar

Analog differential-phase detection in optical coherence reflectometer

• Abstract
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• Optics Express, Vol. 16, Issue 17, pp. 12847-12858 (August 2008)
• Huan-Jang Huang, Tsung-Yu Hsieh, Li-Dek Chou, Wen-Chuan Kuo, Chien Chou

Time-resolved polarimetry over water waves: relating glints and surface statistics

• Abstract

• Applied Optics, Vol. 47, Issue 10, pp. 1638-1648 (April 2008)
• M. Ottaviani, C. Merck, S. Long, J. Koskulics, K. Stamnes, W. Su, W. Wiscombe

Efficiency of polarimetric z probing in optical multilayers

• Abstract

• Applied Optics, Vol. 47, Issue 13, pp. C279-C283 (May 2008)
• Claude Amra, Carole Deumié, Gaelle Georges, Catherine Grèzes-Besset, Frédéric Chazallet

Roughness evolution and scatter losses of multilayers for 193 nm optics

• Abstract

• Applied Optics, Vol. 47, Issue 13, pp. C88-C97 (May 2008)
• Sven Schröder, Angela Duparré, Andreas Tünnermann

Phase-shifting interferometer based on changing the direction of linear polarization orthogonally

• Abstract

• Applied Optics, Vol. 47, Issue 21, pp. 3784-3788 (July 2008)
• Tomohiro Kiire, Suezou Nakadate, Masato Shibuya

Simultaneous formation of four fringes by using a polarization quadrature phase-shifting interferometer with wave plates and a diffraction grating

• Abstract

• Applied Optics, Vol. 47, Issue 26, pp. 4787-4792 (September 2008)
• Tomohiro Kiire, Suezou Nakadate, Masato Shibuya

Three-dimensional shape measurement with a fast and accurate approach

• Abstract

• Applied Optics, Vol. 48, Issue 6, pp. 1052-1061 (February 2009)
• Zhaoyang Wang, Hua Du, Seungbae Park, Huimin Xie

Analysis of the spectral and angular response of the vegetated surface polarization for the purpose of aerosol remote sensing over land

• Abstract

• Applied Optics, Vol. 48, Issue 6, pp. 1228-1236 (February 2009)
• F. Waquet, J. -F. Léon, B. Cairns, P. Goloub, J. -L. Deuzé, F. Auriol

Disturbance-free phase-shifting laser diode interferometer using adaptive feedback control

• Abstract

• Applied Optics, Vol. 48, Issue 29, pp. 5561-5566 (October 2009)
• Takamasa Suzuki, Tsutomu Takahashi, Osami Sasaki

Zirconia-coated carbonyl-iron-particle-based magnetorheological fluid for polishing optical glasses and ceramics

• Abstract

• Applied Optics, Vol. 48, Issue 35, pp. 6797-6810 (December 2009)
• Shai N. Shafrir, Henry J. Romanofsky, Michael Skarlinski, Mimi Wang, Chunlin Miao, Sivan Salzman, Taylor Chartier, Joni Mici, John C. Lambropoulos, Rui Shen, Hong Yang, Stephen D. Jacobs

Overall characterization of assembled optical storage devices with a heterodyne microscope: a qualitative comparison with a confocal microscope

• Abstract

• Applied Optics, Vol. 49, Issue 1, pp. 50-55 (January 2010)
• J. Mauricio Flores, Moisés Cywiak, Fernando Mendoza

Angle-resolved scattering and reflectance of extreme-ultraviolet multilayer coatings: measurement and analysis

• Abstract

• Applied Optics, Vol. 49, Issue 9, pp. 1503-1512 (March 2010)
• Sven Schröder, Tobias Herffurth, Marcus Trost, Angela Duparré

Growth and characterization of InAs quantum dots with low-density and long emission wavelength

• Abstract

• Chinese Optics Letters, Vol. 6, Issue 1, pp. 71-73 (January 2008)
• Lin Li, Guojun Liu, Zhanguo Li, Mei Li, Xiaohua Wang

Extremely low density self-assembled InAs/GaAs quantum dots

• Abstract

• Chinese Optics Letters, Vol. 6, Issue 6, pp. 443-445 (June 2008)
• Lin Li, Guojun Liu, Zhanguo Li, Mei Li, Xiaohua Wang

Measurement of a Mirror Surface Topography Using 2-frame Phase-shifting Digital Interferometry

• Abstract
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• Journal of the Optical Society of Korea, Vol. 13, Issue 2, pp. 245-250 (June 2009)
• Seok-Hee Jeon, Sang-Keun Gil