Unsupervised novelty detection using Gabor filters for defect segmentation in textures

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• JOSA A, Vol. 26, Issue 9, pp. 1967-1976 (September 2009)
• Miquel Ralló, María S. Millán, Jaume Escofet

Through-focus scanning-optical-microscope imaging method for nanoscale dimensional analysis

• Abstract

• Optics Letters, Vol. 33, Issue 17, pp. 1990-1992 (September 2008)
• Ravikiran Attota, Thomas A. Germer, Richard M. Silver

Effects of pupil discretization and Littrow illumination in the simulation of bright-field defect detection

• Abstract

• Optics Letters, Vol. 34, Issue 12, pp. 1840-1842 (June 2009)
• Stephan Rafler, Matthias Petschow, Uwe Seifert, Karsten Frenner, Jens Göckeritz, Wolfgang Osten

Dark-field microscopic image stitching method for surface defects evaluation of large fine optics

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• Optics Express, Vol. 21, Issue 5, pp. 5974-5987 (March 2013)
• Dong Liu, Shitong Wang, Pin Cao, Lu Li, Zhongtao Cheng, Xin Gao, Yongying Yang