Backscattering measurements from double-scale randomly rough surfaces

• Abstract

• JOSA A, Vol. 29, Issue 6, pp. 1154-1160 (June 2012)
• Víctor Ruiz-Cortés, Christopher Dainty

Full polarization optical profilometry

• Abstract

• JOSA A, Vol. 29, Issue 8, pp. 1508-1515 (August 2012)
• S. Arhab, H. Giovannini, K. Belkebir, G. Soriano

Electromagnetic wave scattering from a rough interface above a chiral medium: generalized field transforms

• Abstract

• JOSA A, Vol. 30, Issue 3, pp. 325-334 (March 2013)
• P. E. Crittenden, E. Bahar

Electromagnetic wave scattering from a rough interface above a chiral medium: generalized telegraphists’ equations

• Abstract

• JOSA A, Vol. 30, Issue 3, pp. 335-341 (March 2013)
• E. Bahar, P. E. Crittenden

Coherent effects in the scattering of light from two-dimensional rough metal surfaces

• Abstract

• JOSA A, Vol. 30, Issue 6, pp. 1136-1145 (June 2013)
• Paul Anton Letnes, Tor Nordam, Ingve Simonsen

Coupling of volume and surface effects in scattering, and the “splitting rule”

• Abstract

• Optics Letters, Vol. 37, Issue 12, pp. 2286-2288 (June 2012)
• Saba Mudaliar

Extended propagation-inside-layer expansion method combined with the forward-backward method to study the scattering from an object above a rough surface

• Abstract

• Optics Letters, Vol. 37, Issue 14, pp. 2985-2987 (July 2012)
• Mohammad Kouali, Gildas Kubické, Christophe Bourlier

Satellite peaks in the scattering of light from the two-dimensional randomly rough surface of a dielectric film on a planar metal surface

• Abstract
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• Optics Express, Vol. 20, Issue 10, pp. 11336-11350 (May 2012)
• T. Nordam, P.A. Letnes, I. Simonsen, A.A. Maradudin

Seven-parameter statistical model for BRDF in the UV band

• Abstract
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• Optics Express, Vol. 20, Issue 11, pp. 12085-12094 (May 2012)
• Lu Bai, Zhensen Wu, Xiren Zou, Yunhua Cao

Bi-frequency correlation properties of the scattered intensity from dielectric rough surfaces

• Abstract
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• Optics Express, Vol. 20, Issue 14, pp. 14833-14847 (July 2012)
• Geng Zhang, Zhensen Wu

Analysis of light scattering from surface roughness in hollow-core photonic bandgap fibers

• Abstract
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• Optics Express, Vol. 20, Issue 19, pp. 20980-20991 (September 2012)
• Eric Numkam Fokoua, Francesco Poletti, David J. Richardson

Comparison between periodic and stochastic parabolic light trapping structures for thin-film microcrystalline Silicon solar cells

• Abstract
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• Optics Express, Vol. 20, Issue 28, pp. 29488-29499 (December 2012)
• M. Peters, C. Battaglia, K. Forberich, B. Bläsi, N. Sahraei, A.G. Aberle

Interband scattering in a slow light photonic crystal waveguide under electro-optic tuning

• Abstract
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• Optics Express, Vol. 21, Issue 6, pp. 6756-6763 (March 2013)
• Jun Tan, Richard A. Soref, Wei Jiang

Physical optics solution for the scattering of a partially-coherent wave from a statistically rough material surface

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• Optics Express, Vol. 21, Issue 6, pp. 6807-6825 (March 2013)
• Milo W. Hyde, Santasri Basu, Mark F. Spencer, Salvatore J. Cusumano, Steven T. Fiorino

Robustness of Cantor Diffractals

• Abstract
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• Optics Express, Vol. 21, Issue 7, pp. 7951-7956 (April 2013)
• Rupesh Verma, Manoj Kumar Sharma, Varsha Banerjee, Paramasivam Senthilkumaran

Analytical modeling and three-dimensional finite element simulation of line edge roughness in scatterometry

• Abstract

• Applied Optics, Vol. 51, Issue 27, pp. 6457-6464 (September 2012)
• Akiko Kato, Sven Burger, Frank Scholze

Nanoscale fluctuations and surface tension measurements in droplets using phase-resolved low-coherence interferometry

• Abstract

• Applied Optics, Vol. 52, Issue 1, pp. A177-A181 (January 2013)
• Ru Wang, Taewoo Kim, Mustafa Mir, Gabriel Popescu

Generating random rough edges, surfaces, and volumes

• Abstract

• Applied Optics, Vol. 52, Issue 7, pp. 1472-1480 (March 2013)
• Chris A. Mack

Comprehensive nanostructure and defect analysis using a simple 3D light-scatter sensor

• Abstract

• Applied Optics, Vol. 52, Issue 14, pp. 3279-3287 (May 2013)
• Tobias Herffurth, Sven Schröder, Marcus Trost, Angela Duparré, Andreas Tünnermann

Experimental method for the extraction of intensity profiles by imaging the scattered pattern with a charge-coupled device

• Abstract

• Chinese Optics Letters, Vol. 10, Issue 5, pp. 052901- (May 2012)
• Haixia Li, Meina Zhang, Xiaoyi Chen, Chunxiang Liu, Chuanfu Cheng