Infrared dielectric properties of low-stress silicon nitride

• Abstract

• Optics Letters, Vol. 37, Issue 20, pp. 4200-4202 (October 2012)
• Giuseppe Cataldo, James A. Beall, Hsiao-Mei Cho, Brendan McAndrew, Michael D. Niemack, Edward J. Wollack

Investigation of laser-induced damage by various initiators on the subsurface of fused silica

• Abstract
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• Optics Express, Vol. 20, Issue 20, pp. 22095-22101 (September 2012)
• Xiang Gao, Guoying Feng, Jinghua Han, Lingling Zhai

Improvement on laser-induced damage threshold of sol-gel ZrO₂ coatings by crystal structure tuning

• Abstract
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• Optics Express, Vol. 20, Issue 22, pp. 24482-24487 (October 2012)
• Xiaodong Wang, Guangming Wu, Bin Zhou, Jun Shen

In situ 3D characterization of historical coatings and wood using multimodal nonlinear optical microscopy

• Abstract
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• Optics Express, Vol. 20, Issue 22, pp. 24623-24635 (October 2012)
• Gaël Latour, Jean-Philippe Echard, Marie Didier, Marie-Claire Schanne-Klein

Near infrared enhancement in CIGS-based solar cells utilizing a ZnO:H window layer

• Abstract
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• Optics Express, Vol. 20, Issue 106, pp. A806-A811 (November 2012)
• Chi-Li Yeh, Hung-Ru Hsu, Sheng-Hui Chen, Yung-sheng Liu

Temperature dependent optical properties of amorphous silicon for diode laser crystallization

• Abstract
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• Optics Express, Vol. 20, Issue 106, pp. A856-A863 (November 2012)
• Joachim Bergmann, Martin Heusinger, Gudrun Andrä, Fritz Falk

An optical test for identifying topological insulator thin films

• Abstract
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• Optics Express, Vol. 21, Issue 7, pp. 8564-8569 (April 2013)
• Jun-ichi Inoue

Computational manufacturing as a key element in the design–production chain for modern multilayer coatings

• Abstract

• Applied Optics, Vol. 51, Issue 31, pp. 7604-7615 (November 2012)
• Tatiana V. Amotchkina, Sebastian Schlichting, Henrik Ehlers, Michael K. Trubetskov, Alexander V. Tikhonravov, Detlev Ristau

Micro energy dispersive x-ray fluorescence as a powerful complementary technique for the analysis of bimetallic Au/Ag/glass nanolayer composites used in surface plasmon resonance sensors

• Abstract

• Applied Optics, Vol. 51, Issue 32, pp. 7733-7738 (November 2012)
• Mohammad Ghorbanpour, Cavus Falamaki

Advanced error identification in deposition of complex optical layer systems by a multianalyzing approach

• Abstract

• Applied Optics, Vol. 51, Issue 34, pp. 8203-8210 (December 2012)
• Carsten Schmitz, Henrik Ehlers, Detlev Ristau

Effects of substrate temperatures and deposition rates on properties of aluminum fluoride thin films in deep-ultraviolet region

• Abstract

• Applied Optics, Vol. 51, Issue 35, pp. 8481-8489 (December 2012)
• Jian Sun, Xu Li, Weili Zhang, Kui Yi, Jianda Shao

Computational manufacturing as a tool for the selection of the most manufacturable design

• Abstract

• Applied Optics, Vol. 51, Issue 36, pp. 8677-8686 (December 2012)
• Tatiana V. Amotchkina, Sebastian Schlichting, Henrik Ehlers, Michael K. Trubetskov, Alexander V. Tikhonravov, Detlev Ristau

Optimization of thickness uniformity of optical coatings on a conical substrate in a planetary rotation system

• Abstract

• Applied Optics, Vol. 52, Issue 4, pp. B26-B32 (February 2013)
• Chun Guo, Mingdong Kong, Cunding Liu, Bincheng Li

Postanalyses of an optical multilayer interference filter using numerical reverse synthesis and Rutherford backscattering spectrometry

• Abstract

• Applied Optics, Vol. 52, Issue 10, pp. 2102-2115 (April 2013)
• Naba Kishore Sahoo, Sanjiv Kumar, Raj Bahadur Tokas, Shuvendu Jena, Sudhakar Thakur, Gundlapally Laxmi Narasimha Reddy

High active carrier concentration in n-type, thin film Ge using delta-doping

• Abstract
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• Optical Materials Express, Vol. 2, Issue 11, pp. 1462-1469 (November 2012)
• Rodolfo E. Camacho-Aguilera, Yan Cai, Jonathan T. Bessette, Lionel C. Kimerling, Jurgen Michel

Effect of annealing conditions on the physio-chemical properties of spin-coated As₂Se₃ chalcogenide glass films

• Abstract
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• Optical Materials Express, Vol. 2, Issue 12, pp. 1723-1732 (December 2012)
• Yi Zou, Hongtao Lin, Okechukwu Ogbuu, Lan Li, Sylvain Danto, Spencer Novak, Jacklyn Novak, J. David Musgraves, Kathleen Richardson, Juejun Hu

Synthesis of CIGS thin film by solvothermal route

• Abstract
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• Optical Materials Express, Vol. 3, Issue 1, pp. 54-66 (January 2013)
• Hsiang-Chen Wang, Chao-Chi Wang, Shih-Wei Feng, Li-His Chen, Yen-Sheng Lin

A micro-Raman spectroscopic investigation of He⁺-irradiation damage in LiNbO₃

• Abstract
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• Optical Materials Express, Vol. 3, Issue 2, pp. 126-142 (February 2013)
• Hsu-Cheng Huang, Jerry I. Dadap, Ophir Gaathon, Irving P. Herman, Richard M. Osgood, Sasha Bakhru, Hassaram Bakhru

Germanium-on-Glass solar cells: fabrication and characterization

• Abstract
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• Optical Materials Express, Vol. 3, Issue 2, pp. 216-228 (February 2013)
• Vito Sorianello, Lorenzo Colace, Carlo Maragliano, Dominic Fulgoni, Lee Nash, Gaetano Assanto

Laser tailoring surface interactions, contact angles, drop topologies and the self-assembly of optical microwires

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• Optical Materials Express, Vol. 3, Issue 2, pp. 284-294 (February 2013)
• John Canning, Hadrien Weil, Masood Naqshbandi, Kevin Cook, Matthieu Lancry