High-resolution ab initio three-dimensional x-ray diffraction microscopy

• Abstract

• JOSA A, Vol. 23, Issue 5, pp. 1179-1200 (May 2006)
• Henry N. Chapman, Anton Barty, Stefano Marchesini, Aleksandr Noy, Stefan P. Hau-Riege, Congwu Cui, Malcolm R. Howells, Rachel Rosen, Haifeng He, John C. H. Spence, Uwe Weierstall, Tobias Beetz, Chris Jacobsen, David Shapiro

Condenser for Koehler-like illumination in transmission x-ray microscopes at undulator sources

• Abstract

• Optics Letters, Vol. 31, Issue 10, pp. 1465-1467 (May 2006)
• Ulrich Vogt, Magnus Lindblom, Pambos Charalambous, Burkhard Kaulich, Thomas Wilhein

Single-element objective lens for soft x-ray differential interference contrast microscopy

• Abstract

• Optics Letters, Vol. 31, Issue 10, pp. 1564-1566 (May 2006)
• Chang Chang, Anne Sakdinawat, Peter Fischer, Erik Anderson, David Attwood

Submicrometer digital in-line holographic microscopy at 32 nm with high-order harmonics

• Abstract

• Optics Letters, Vol. 31, Issue 21, pp. 3095-3097 (November 2006)
• Anne-Sophie Morlens, Julien Gautier, Gilles Rey, Philippe Zeitoun, Jean-Pascal Caumes, Marylène Kos-Rosset, Hamed Merdji, Sophie Kazamias, Kevin Cassou, Marta Fajardo

Crystal optics as guard apertures for coherent x-ray diffraction imaging

• Abstract

• Optics Letters, Vol. 31, Issue 21, pp. 3194-3196 (November 2006)
• Xianghui Xiao, Martin D. de Jonge, Yuncheng Zhong, Yong S. Chu, Qun Shen

Soft-x-ray microscopy using spiral zone plates

• Abstract

• Optics Letters, Vol. 32, Issue 18, pp. 2635-2637 (September 2007)
• Anne Sakdinawat, Yanwei Liu

Compact Zernike phase contrast x-ray microscopy using a single-element optic

• Abstract

• Optics Letters, Vol. 33, Issue 9, pp. 932-934 (May 2008)
• O. von Hofsten, M. Bertilson, M. Lindblom, A. Holmberg, U. Vogt

Compact soft x-ray microscope using a gas-discharge light source

• Abstract

• Optics Letters, Vol. 33, Issue 20, pp. 2359-2361 (October 2008)
• Markus Benk, Klaus Bergmann, David Schäfer, Thomas Wilhein

Elemental mapping and microimaging by x-ray capillary optics

• Abstract

• Optics Letters, Vol. 33, Issue 23, pp. 2743-2745 (December 2008)
• D. Hampai, S. B. Dabagov, G. Cappuccio, A. Longoni, T. Frizzi, G. Cibin, V. Guglielmotti, M. Sala

Phase retrieval in x-ray lensless holography by reference beam tuning

• Abstract

• Optics Letters, Vol. 34, Issue 17, pp. 2604-2606 (September 2009)
• Diling Zhu, Benny Wu, Ramon Rick, Joachim Stöhr, Andreas Scherz

Sub-25-nm laboratory x-ray microscopy using a compound Fresnel zone plate

• Abstract

• Optics Letters, Vol. 34, Issue 17, pp. 2631-2633 (September 2009)
• Olov von Hofsten, Michael Bertilson, Julia Reinspach, Anders Holmberg, Hans M. Hertz, Ulrich Vogt

X-ray ultramicroscopy using integrated sample cells

• Abstract
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• Optics Express, Vol. 14, Issue 17, pp. 7889-7894 (August 2006)
• Dachao Gao, Stephen W. Wilkins, David J. Parry, Tim E. Gureyev, Peter R. Miller, Eric Hanssen

Phase contrast soft x-ray microscopy using Zernike zone plates

• Abstract
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• Optics Express, Vol. 16, Issue 3, pp. 1559-1564 (February 2008)
• Anne Sakdinawat, Yanwei Liu

Quantitative phase measurement in coherent diffraction imaging

• Abstract
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• Optics Express, Vol. 16, Issue 5, pp. 3342-3348 (March 2008)
• J. N. Clark, G. J. Williams, H. M. Quiney, L. Whitehead, M. D. de Jonge, E. Hanssen, M. Altissimo, K. A. Nugent, A. G. Peele

Fresnel diffraction in the case of an inclined image plane

• Abstract
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• Optics Express, Vol. 16, Issue 7, pp. 5141-5149 (March 2008)
• Peter Modregger, Daniel Lübbert, Peter Schäfer, Rolf Köhler, Timm Weitkamp, Michael Hanke, Tilo Baumbach

Laguerre-Gaussian radial Hilbert transform for edge-enhancement Fourier transform x-ray microscopy

• Abstract
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• Optics Express, Vol. 17, Issue 7, pp. 5533-5539 (March 2009)
• Nándor Bokor, Yoshinori Iketaki

Influence of partial coherence on analyzer-based imaging with asymmetric Bragg reflection

• Abstract
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• Optics Express, Vol. 17, Issue 14, pp. 11618-11637 (July 2009)
• Peter Modregger, Daniel Lübbert, Peter Schäfer, Jane Richter, Rolf Köhler, Tilo Baumbach

Demonstration of 12 nm Resolution Fresnel Zone Plate Lens based Soft X-ray Microscopy

• Abstract
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• Optics Express, Vol. 17, Issue 20, pp. 17669-17677 (September 2009)
• Weilun Chao, Jihoon Kim, Senajith Rekawa, Peter Fischer, Erik H. Anderson

Fabrication of x-ray zone plates by surface-plasma chemical vapor deposition

• Abstract

• Applied Optics, Vol. 46, Issue 23, pp. 5964-5966 (August 2007)
• K. M. Golant, S. V. Lavrishchev, A. V. Popov, I. A. Artyukov, R. M. Feshchenko, A. N. Mitrofanov, A. V. Vinogradov

Study of X-ray Kirkpatrick-Baez imaging with single layer

• Abstract

• Chinese Optics Letters, Vol. 7, Issue 5, pp. 452-454 (May 2009)
• Baozhong Mu, Zhanshan Wang, Shengzhen Yi, Xin Wang, Shengling Huang, Jingtao Zhu, Chengchao Huang