Exact space invariant illumination for partially coherent imaging systems

• Abstract

• JOSA A, Vol. 27, Issue 9, pp. 1953-1961 (September 2010)
• Takashi Nakamura, Chang Chang

Spiral photon sieves apodized by digital prolate spheroidal window for the generation of hard-x-ray vortex

• Abstract

• Optics Letters, Vol. 35, Issue 11, pp. 1765-1767 (June 2010)
• Changqing Xie, Xiaoli Zhu, Lina Shi, Ming Liu

One-dimensional Wolter optics with a sub-50 nm spatial resolution

• Abstract

• Optics Letters, Vol. 35, Issue 21, pp. 3583-3585 (November 2010)
• S. Matsuyama, T. Wakioka, N. Kidani, T. Kimura, H. Mimura, Y. Sano, Y. Nishino, M. Yabashi, K. Tamasaku, T. Ishikawa, K. Yamauchi

Zernike apodized photon sieves for high-resolution phase-contrast x-ray microscopy

• Abstract

• Optics Letters, Vol. 35, Issue 21, pp. 3610-3612 (November 2010)
• Guanxiao Cheng, Chao Hu, Ping Xu, Tingwen Xing

Feasibility study of hard-x-ray nanofocusing above 20 keV using compound photon sieves

• Abstract

• Optics Letters, Vol. 35, Issue 23, pp. 4048-4050 (December 2010)
• Changqing Xie, Xiaoli Zhu, Hailiang Li, Lina Shi, Yanhua Wang

Hard x-ray Zernike microscopy reaches 30 nm resolution

• Abstract
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• Optics Letters, Vol. 36, Issue 7, pp. 1269-1271 (April 2011)
• Yu-Tung Chen, Tsung-Yu Chen, Jaemock Yi, Yong S. Chu, Wah-Keat Lee, Cheng-Liang Wang, Ivan M. Kempson, Y. Hwu, Vincent Gajdosik, G. Margaritondo

Resonance modes filtering in structured x-ray waveguides

• Abstract

• Optics Letters, Vol. 36, Issue 14, pp. 2602-2604 (July 2011)
• Inna Bukreeva, Alessia Cedola, Andrea Sorrentino, Daniele Pelliccia, Viktor Asadchikov, Stefano Lagomarsino

High throughput and wide field of view EUV microscope for blur-free one-shot imaging of living organisms

• Abstract
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• Optics Express, Vol. 18, Issue 7, pp. 7203-7209 (March 2010)
• Takeo Ejima, Fumihiko Ishida, Hiromichi Murata, Mitsunori Toyoda, Tetsuo Harada, Toshihide Tsuru, Tadashi Hatano, Mihiro Yanagihara, Masaki Yamamoto, Haruo Mizutani

Fresnel coherent diffraction tomography

• Abstract
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• Optics Express, Vol. 18, Issue 11, pp. 11746-11753 (May 2010)
• C. T. Putkunz, M. A. Pfeifer, A. G. Peele, G. J. Williams, H. M. Quiney, B. Abbey, K. A. Nugent, I. McNulty

X-ray phase contrast microscopy at 300 nm resolution with laboratory sources

• Abstract
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• Optics Express, Vol. 18, Issue 15, pp. 15998-16004 (July 2010)
• Daniele Pelliccia, Andrea Sorrentino, Inna Bukreeva, Alessia Cedola, Fernando Scarinci, Mihaela Ilie, Anna Maria Gerardino, Michela Fratini, Stefano Lagomarsino

Ultra-high resolution zone-doubled diffractive X-ray optics for the multi-keV regime

• Abstract
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• Optics Express, Vol. 19, Issue 1, pp. 175-184 (January 2011)
• Joan Vila-Comamala, Sergey Gorelick, Elina Färm, Cameron M. Kewish, Ana Diaz, Ray Barrett, Vitaliy A. Guzenko, Mikko Ritala, Christian David

Phase retrieval using polychromatic illumination for transmission X-ray microscopy

• Abstract
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• Optics Express, Vol. 19, Issue 2, pp. 540-545 (January 2011)
• Yijin Liu, Joy C. Andrews, Junyue Wang, Florian Meirer, Peiping Zhu, Ziyu Wu, Piero Pianetta

Numerical model for tomographic image formation in transmission x-ray microscopy

• Abstract
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• Optics Express, Vol. 19, Issue 12, pp. 11578-11583 (June 2011)
• Michael Bertilson, Olov von Hofsten, Hans M. Hertz, Ulrich Vogt

Quantitative characterization of x-ray differential interference contrast microscopy using modulation transfer function

• Abstract
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• Optics Express, Vol. 19, Issue 16, pp. 15304-15321 (August 2011)
• Takashi Nakamura, Chang Chang

Full optical characterization of coherent x-ray nanobeams by ptychographic imaging

• Abstract
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• Optics Express, Vol. 19, Issue 17, pp. 16324-16329 (August 2011)
• Susanne Hönig, Robert Hoppe, Jens Patommel, Andreas Schropp, Sandra Stephan, Sebastian Schöder, Manfred Burghammer, Christian G. Schroer

Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging

• Abstract
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• Optics Express, Vol. 19, Issue 22, pp. 21333-21344 (October 2011)
• Joan Vila-Comamala, Ana Diaz, Manuel Guizar-Sicairos, Alexandre Mantion, Cameron M. Kewish, Andreas Menzel, Oliver Bunk, Christian David

Ultrahigh 22 nm resolution coherent diffractive imaging using a desktop 13 nm high harmonic source

• Abstract
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• Optics Express, Vol. 19, Issue 23, pp. 22470-22479 (November 2011)
• Matthew D. Seaberg, Daniel E. Adams, Ethan L. Townsend, Daisy A. Raymondson, William F. Schlotter, Yanwei Liu, Carmen S. Menoni, Lu Rong, Chien-Chun Chen, Jianwei Miao, Henry C. Kapteyn, Margaret M. Murnane

Three-dimensional structure of a single colloidal crystal grain studied by coherent x-ray diffraction

• Abstract
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• Optics Express, Vol. 20, Issue 4, pp. 4039-4049 (February 2012)
• J. Gulden, O. M. Yefanov, A. P. Mancuso, R. Dronyak, A. Singer, V. Bernátová, A. Burkhardt, O. Polozhentsev, A. Soldatov, M. Sprung, I. A. Vartanyants

Interpretation of dark-field contrast and particle-size selectivity in grating interferometers

• Abstract

• Applied Optics, Vol. 50, Issue 22, pp. 4310-4319 (August 2011)
• Susanna K. Lynch, Vinay Pai, Julie Auxier, Ashley F. Stein, Eric E. Bennett, Camille K. Kemble, Xianghui Xiao, Wah-Keat Lee, Nicole Y. Morgan, Han Harold Wen

Thinning and polishing of cross-section of depth-graded WSi₂/Si multilayer for linear zone plate application

• Abstract

• Chinese Optics Letters, Vol. 10, Issue 1, pp. 013103- (January 2012)
• Qiushi Huang, Jingtao Zhu, Haochuan Li, Zhengxiang Shen, Xiaoqiang Wang, Zhanshan Wang, Yongjian Tang