Efficiency of linear-to-circular polarization conversion for light reflection at the principal angle by a dielectric-conductor interface

• Abstract

• JOSA A, Vol. 25, Issue 4, pp. 834-837 (April 2008)
• R. M. A. Azzam, A. Alsamman

Comparative extreme ultraviolet emission measurements for lithium and tin laser plasmas

• Abstract

• Optics Letters, Vol. 32, Issue 8, pp. 997-999 (April 2007)
• Simi A. George, William T. Silfvast, Kazutoshi Takenoshita, Robert T. Bernath, Chiew-Seng Koay, Gregory Shimkaveg, Martin C. Richardson

Metrologies for the phase characterization of attosecond extreme ultraviolet optics

• Abstract

• Optics Letters, Vol. 33, Issue 5, pp. 455-457 (March 2008)
• Andrew Aquila, Farhad Salmassi, Eric Gullikson

A non-iterative reconstruction method for direct and unambiguous coherent diffractive imaging

• Abstract
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• Optics Express, Vol. 15, Issue 16, pp. 9954-9962 (August 2007)
• S. G. Podorov, K. M. Pavlov, D. M. Paganin

An analytical approach to estimating aberrations in curved multilayer optics for hard x-rays: 1. Derivation of caustic shapes

• Abstract
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• Optics Express, Vol. 16, Issue 16, pp. 12050-12059 (August 2008)
• J.-P. Guigay, Ch. Morawe, V. Mocella, C. Ferrero

An analytical approach to estimating aberrations in curved multilayer optics for hard x-rays: 2. Interpretation and application to focusing experiments

• Abstract
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• Optics Express, Vol. 16, Issue 20, pp. 16138-16150 (September 2008)
• Ch. Morawe, J.-P. Guigay, V. Mocella, C. Ferrero

Figuring of plano-elliptical neutron focusing mirror by local wet etching

• Abstract
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• Optics Express, Vol. 17, Issue 8, pp. 6414-6420 (April 2009)
• Kazuya Yamamura, Mikinori Nagano, Hiroyuki Takai, Nobuyuki Zettsu, Dai Yamazaki, Ryuji Maruyama, Kazuhiko Soyama, Shoichi Shimada

High-efficiency collector design for extreme-ultraviolet and x-ray applications

• Abstract

• Applied Optics, Vol. 45, Issue 35, pp. 8882-8888 (December 2006)
• Fabio E. Zocchi

Micropore x-ray optics using anisotropic wet etching of (110) silicon wafers

• Abstract

• Applied Optics, Vol. 45, Issue 35, pp. 8932-8938 (December 2006)
• Yuichiro Ezoe, Masaki Koshiishi, Makoto Mita, Kazuhisa Mitsuda, Akio Hoshino, Yoshitaka Ishisaki, Zhen Yang, Takayuki Takano, Ryutaro Maeda

Measurements of the hard-x-ray reflectivity of iridium

• Abstract

• Applied Optics, Vol. 46, Issue 2, pp. 185-189 (January 2007)
• S. Romaine, R. Bruni, P. Gorenstein, Z. Zhong

Wave-optical simulation of hard-x-ray nanofocusing by precisely figured elliptical mirrors

• Abstract

• Applied Optics, Vol. 46, Issue 11, pp. 2010-2021 (April 2007)
• Cameron M. Kewish, Lahsen Assoufid, Albert T. Macrander, Jun Qian

Figure tolerance of a Wolter type I mirror for a soft-x-ray microscope

• Abstract

• Applied Optics, Vol. 46, Issue 14, pp. 2663-2669 (May 2007)
• Kwon Su Chon, Yoshiharu Namba, Kwon-Ha Yoon

Atomic force microscopy characterization of Zerodur mirror substrates for the extreme ultraviolet telescopes aboard NASA's Solar Dynamics Observatory

• Abstract

• Applied Optics, Vol. 46, Issue 16, pp. 3156-3163 (June 2007)
• Regina Soufli, Sherry L. Baker, David L. Windt, Eric M. Gullikson, Jeff C. Robinson, William A. Podgorski, Leon Golub

Camera for coherent diffractive imaging and holography with a soft-x-ray free-electron laser

• Abstract

• Applied Optics, Vol. 47, Issue 10, pp. 1673-1683 (April 2008)
• Saša Bajt, Henry N. Chapman, Eberhard A. Spiller, Jennifer B. Alameda, Bruce W. Woods, Matthias Frank, Michael J. Bogan, Anton Barty, Sebastien Boutet, Stefano Marchesini, Stefan P. Hau-Riege, Janos Hajdu, David Shapiro

Ellipsoidal and parabolic glass capillaries as condensers for x-ray microscopes

• Abstract

• Applied Optics, Vol. 47, Issue 13, pp. 2376-2381 (May 2008)
• Xianghui Zeng, Fred Duewer, Michael Feser, Carson Huang, Alan Lyon, Andrei Tkachuk, Wenbing Yun

Atomic scale interface engineering by modulated ion-assisted deposition applied to soft x-ray multilayer optics

• Abstract

• Applied Optics, Vol. 47, Issue 23, pp. 4196-4204 (August 2008)
• Fredrik Eriksson, Naureen Ghafoor, Franz Schäfers, Eric M. Gullikson, Samir Aouadi, Susanne Rohde, Lars Hultman, Jens Birch

Possibility of corrector plate tuning of x-ray focusing

• Abstract

• Applied Optics, Vol. 48, Issue 13, pp. 2522-2535 (May 2009)
• Richard Talman

Shaped silicon wafers obtained by hot plastic deformation: performance evaluation for future astronomical x-ray telescopes

• Abstract

• Applied Optics, Vol. 48, Issue 19, pp. 3830-3838 (July 2009)
• Yuichiro Ezoe, Takayuki Shirata, Ikuyuki Mitsuishi, Manabu Ishida, Kazuhisa Mitsuda, Kohei Morishita, Kazuo Nakajima

B4C/Mo/Si high reflectivity multilayer mirror at 30.4 nm

• Abstract

• Chinese Optics Letters, Vol. 4, Issue 10, pp. 611-613 (October 2006)
• Zhanshan Wang, Shumin Zhang, Wenjuan Wu, Jingtao Zhu, Hongchang Wang, Cunxia Li, Yao Xu, Fengli Wang, Zhong Zhang, Lingyan Chen, Hongjun Zhou, Tonglin Huo

Study of X-ray Kirkpatrick-Baez imaging with single layer

• Abstract

• Chinese Optics Letters, Vol. 7, Issue 5, pp. 452-454 (May 2009)
• Baozhong Mu, Zhanshan Wang, Shengzhen Yi, Xin Wang, Shengling Huang, Jingtao Zhu, Chengchao Huang