X-ray Schwarzschild objective for the carbon window (λ~4.5 nm)

• Abstract

• Optics Letters, Vol. 34, Issue 19, pp. 2930-2932 (October 2009)
• Igor Artyukov, Yegor Bugayev, Olexander Devizenko, Eric Gullikson, Valeriy Kondratenko, Alexander Vinogradov

One-dimensional Wolter optics with a sub-50 nm spatial resolution

• Abstract

• Optics Letters, Vol. 35, Issue 21, pp. 3583-3585 (November 2010)
• S. Matsuyama, T. Wakioka, N. Kidani, T. Kimura, H. Mimura, Y. Sano, Y. Nishino, M. Yabashi, K. Tamasaku, T. Ishikawa, K. Yamauchi

Figuring of plano-elliptical neutron focusing mirror by local wet etching

• Abstract
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• Optics Express, Vol. 17, Issue 8, pp. 6414-6420 (April 2009)
• Kazuya Yamamura, Mikinori Nagano, Hiroyuki Takai, Nobuyuki Zettsu, Dai Yamazaki, Ryuji Maruyama, Kazuhiko Soyama, Shoichi Shimada

Predicting the coherent X-ray wavefront focal properties at the Linac Coherent Light Source (LCLS) X-ray free electron laser

• Abstract
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• Optics Express, Vol. 17, Issue 18, pp. 15508-15519 (August 2009)
• Anton Barty, Regina Soufli, Tom McCarville, Sherry L. Baker, Michael J. Pivovaroff, Peter Stefan, Richard Bionta

High-speed asynchronous optical sampling with sub-50fs time resolution

• Abstract
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• Optics Express, Vol. 18, Issue 6, pp. 5974-5983 (March 2010)
• R. Gebs, G. Klatt, C. Janke, T. Dekorsy, A. Bartels

Reconstruction of an astigmatic hard X-ray beam and alignment of K-B mirrors from ptychographic coherent diffraction data

• Abstract
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• Optics Express, Vol. 18, Issue 22, pp. 23420-23427 (October 2010)
• Cameron M. Kewish, Manuel Guizar-Sicairos, Chian Liu, Jun Qian, Bing Shi, Christa Benson, Ali M. Khounsary, Joan Vila-Comamala, Oliver Bunk, James R. Fienup, Albert T. Macrander, Lahsen Assoufid

Effect of separating layer thickness on W/Si multilayer replication

• Abstract
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• Optics Express, Vol. 19, Issue 17, pp. 15929-15936 (August 2011)
• Fangfang Wang, Baozhong Mu, Huijun Jin, Xiajun Yang, Jingtao Zhu, Zhanshan Wang

X-ray optics simulation using Gaussian superposition technique

• Abstract
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• Optics Express, Vol. 19, Issue 20, pp. 19050-19060 (September 2011)
• Mourad Idir, Moisés Cywiak, Arquímedes Morales, Mohammed H. Modi

Ellipsometry with randomly varying polarization states

• Abstract
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• Optics Express, Vol. 20, Issue 2, pp. 870-878 (January 2012)
• Feng Liu, Chris J. Lee, Juequan Chen, Eric Louis, Peter J. M. van der Slot, Klaus J. Boller, Fred Bijkerk

Possibility of corrector plate tuning of x-ray focusing

• Abstract

• Applied Optics, Vol. 48, Issue 13, pp. 2522-2535 (May 2009)
• Richard Talman

Shaped silicon wafers obtained by hot plastic deformation: performance evaluation for future astronomical x-ray telescopes

• Abstract

• Applied Optics, Vol. 48, Issue 19, pp. 3830-3838 (July 2009)
• Yuichiro Ezoe, Takayuki Shirata, Ikuyuki Mitsuishi, Manabu Ishida, Kazuhisa Mitsuda, Kohei Morishita, Kazuo Nakajima

Broadband extreme ultraviolet multilayer mirror for supercontinuum light at a photon energy of 35-65 eV

• Abstract

• Applied Optics, Vol. 48, Issue 29, pp. 5464-5466 (October 2009)
• Masatoshi Hatayama, Hisataka Takenaka, Eric M. Gullikson, Akira Suda, Katsumi Midorikawa

Optical properties of boron carbide near the boron K edge evaluated by soft-x-ray reflectometry from a Ru/B₄C multilayer

• Abstract

• Applied Optics, Vol. 48, Issue 35, pp. 6684-6691 (December 2009)
• Dmitriy Ksenzov, Tobias Panzner, Christoph Schlemper, Christian Morawe, Ullrich Pietsch

Evaluation of the soft x-ray reflectivity of micropore optics using anisotropic wet etching of silicon wafers

• Abstract

• Applied Optics, Vol. 49, Issue 6, pp. 1007-1011 (February 2010)
• Ikuyuki Mitsuishi, Yuichiro Ezoe, Masaki Koshiishi, Makoto Mita, Yoshitomo Maeda, Noriko Y. Yamasaki, Kazuhisa Mitsuda, Takayuki Shirata, Takayuki Hayashi, Takayuki Takano, Ryutaro Maeda

Development of an alternating magnetic-field-assisted finishing process for microelectromechanical systems micropore x-ray optics

• Abstract

• Applied Optics, Vol. 49, Issue 18, pp. 3511-3521 (June 2010)
• Raul E. Riveros, Hitomi Yamaguchi, Ikuyuki Mitsuishi, Utako Takagi, Yuichiro Ezoe, Fumiki Kato, Susumu Sugiyama, Noriko Yamasaki, Kazuhisa Mitsuda

DynamiX, numerical tool for design of next-generation x-ray telescopes

• Abstract

• Applied Optics, Vol. 49, Issue 21, pp. 4077-4087 (July 2010)
• Maxime Chauvin, Jean-Pierre Roques

Thermal and stress studies of normal incidence Mo/B₄C multilayers for a 6.7 nm wavelength

• Abstract

• Applied Optics, Vol. 50, Issue 11, pp. 1610-1619 (April 2011)
• Miriam Barthelmess, Saša Bajt

Exact revision of the elliptically bent mirror theory

• Abstract

• Applied Optics, Vol. 50, Issue 16, pp. 2413-2417 (June 2011)
• Chengwen Mao, Xiaohan Yu, Tiqiao Xiao, Aiguo Li, Ke Yang, Hua Wang, Fen Yan, Biao Deng

Study of X-ray Kirkpatrick-Baez imaging with single layer

• Abstract

• Chinese Optics Letters, Vol. 7, Issue 5, pp. 452-454 (May 2009)
• Baozhong Mu, Zhanshan Wang, Shengzhen Yi, Xin Wang, Shengling Huang, Jingtao Zhu, Chengchao Huang

Epoxy replication of hard X-ray supermirrors

• Abstract

• Chinese Optics Letters, Vol. 9, Issue 9, pp. 091601- (September 2011)
• Fangfang Wang, Wenbin Li, Qiushi Huang, Jingtao Zhu, Baozhong Mu, Zhanshan Wang