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Article Information

Yu-Tung Chen, Tsung-Yu Chen, Jaemock Yi, Yong S. Chu, Wah-Keat Lee, Cheng-Liang Wang, Ivan M. Kempson, Y. Hwu, Vincent Gajdosik, and G. Margaritondo, "Hard x-ray Zernike microscopy reaches 30 nm resolution," Opt. Lett. 36, 1269-1271 (2011)

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