OSA's Digital Library

Optical Materials Express

Optical Materials Express

  • Editor: David J. Hagan
  • Vol. 1, Iss. 7 — Nov. 1, 2011
  • pp: 1244–1250

Role of ablation and incubation processes on surface nanograting formation

Feng Liang, Réal Vallée, Daniel Gingras, and See Leang Chin  »View Author Affiliations

Optical Materials Express, Vol. 1, Issue 7, pp. 1244-1250 (2011)

View Full Text Article

Enhanced HTML    Acrobat PDF (1884 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



The role of ablation and incubation processes in the formation of surface nanogratings with femtosecond pulses were investigated by measuring ablation thresholds and depth of nanogrooves at different pulse to pulse spacings. Our observations indicated that the nanograting formation essentially relies on a laser ablation process which can be modeled by a simple set of equations.

© 2011 OSA

OCIS Codes
(140.3390) Lasers and laser optics : Laser materials processing
(140.3440) Lasers and laser optics : Laser-induced breakdown
(220.4241) Optical design and fabrication : Nanostructure fabrication
(050.6624) Diffraction and gratings : Subwavelength structures

ToC Category:
Laser Materials Processing

Original Manuscript: August 19, 2011
Revised Manuscript: October 5, 2011
Manuscript Accepted: October 9, 2011
Published: October 13, 2011

Feng Liang, Réal Vallée, Daniel Gingras, and See Leang Chin, "Role of ablation and incubation processes on surface nanograting formation," Opt. Mater. Express 1, 1244-1250 (2011)

Sort:  Author  |  Year  |  Journal  |  Reset  


  1. D. K. Sardar, M. F. Becker, and R. M. Walser, “Multipulse laser damage of GaAs surfaces,” J. Appl. Phys.62, 3688–3693 (1987). [CrossRef]
  2. Y. Jee, M. F. Becker, and R. M. Walser, “Laser-induced damage on single-crystal metal surfaces,” J. Opt. Soc. Am. B5, 648–659 (1988). [CrossRef]
  3. D. Ashkenasi, M. Lorenz, R. Stoian, and A. Rosenfeld, “Surface damage threshold and structuring of dielectrics using femtosecond laser pulses: the role of incubation,” Appl. Surf. Sci.150, 101–106 (1999). [CrossRef]
  4. A. Rosenfeld, M. Lorenz, R. Stoian, and D. Ashkenasi, “Ultrashort-laser-pulse damage threshold of transparent materials and the role of incubation,” Appl. Phys. A69, S373–S376 (1999). [CrossRef]
  5. M. Lenzner, J. Krüger, W. Kautek, and F. Krausz, “Incubation of laser ablation in fused silica with 5-fs pulses,” Appl. Phys. A69, 465–466 (1999). [CrossRef]
  6. X. Liu, D. Du, and G. Mourou, “Laser ablation and micromachining with ultrashort laser pulses,” IEEE J. Quantum Electron.33, 1707–1716 (1997). [CrossRef]
  7. F. Liang, Q. Sun, D. Gingras, R. Vallée, and S. L. Chin, “The transition from smooth modification to nanograting in fused silica,” Appl. Phys. Lett.96, 101903 (2010). [CrossRef]
  8. Y. Barad, H. Eisenberg, M. Horowitz, and Y. Silberberg, “Nonlinear scanning laser microscopy by third harmonic generation,” Appl. Phys. Lett.70, 922–924 (1997). [CrossRef]
  9. F. Liang, Q. Sun, R. Vallée, and S. L. Chin, “Multiple refocusing characterization and critical power measurement using third harmonic generation at interface,” Appl. Phys. B99, 235–239 (2009). [CrossRef]
  10. C. Phipps, Laser Ablation and Its Applications (Springer, 2006).
  11. V. R. Bhardwaj, E. Simova, P. P. Rajeev, C. Hnatovsky, R. S. Taylor, D. M. Rayner, and P. B. Corkum, “Optically produced arrays of planar nanostructures inside fused silica,” Phys. Rev. Lett.96, 057404 (2006). [CrossRef] [PubMed]
  12. X. Guo, R. Li, Y. Hang, Z. Xu, B. Yu, Y. Dai, B. Lu, and X. Sun, “Coherent linking of periodic nano-ripples on a ZnO crystal surface induced by femtosecond laser pulses,” Appl. Phys. A94, 423–426 (2009). [CrossRef]
  13. J. Liu, “Simple technique for measurements of pulsed Gaussian-beam spot sizes,” Opt. Lett.7, 196–198 (1982). [CrossRef] [PubMed]
  14. N. Sanner, O. Utéza, B. Bussiere, G. Coustillier, A. Leray, T. Itina, and M. Sentis, “Measurement of femtosecond laser-induced damage and ablation thresholds in dielectrics,” Appl. Phys. A94, 889–897 (2009). [CrossRef]
  15. L. A. Giannuzzi and F. A. Stevie, Introduction to Focused Ion Beams (Springer Science + Business Media, Inc., 2005). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


Fig. 1 Fig. 2 Fig. 3
Fig. 4 Fig. 5

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited