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Optical Materials Express

Optical Materials Express

  • Editor: David J. Hagan
  • Vol. 2, Iss. 12 — Dec. 1, 2012
  • pp: 1776–1790

Dual-arm Z-scan technique to extract dilute solute nonlinearities from solution measurements

Manuel R. Ferdinandus, Matthew Reichert, Trenton R. Ensley, Honghua Hu, Dmitry A. Fishman, Scott Webster, David J. Hagan, and Eric W. Van Stryland  »View Author Affiliations

Optical Materials Express, Vol. 2, Issue 12, pp. 1776-1790 (2012)

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We present a technique in which small solute nonlinearities may be extracted from large solvent signals by performing simultaneous Z-scans on two samples (solvent and solution). By using a dual-arm Z-scan apparatus with identical arms, fitting error in determining the solute nonlinearity is reduced because the irradiance fluctuations are correlated for both the solvent and solution measurements. To verify the sensitivity of this technique, the dispersion of nonlinear refraction of a squaraine molecule is measured. Utilizing this technique allows for the effects of the solvent n2 to be effectively eliminated, thus overcoming a longstanding problem in nonlinear optical characterization of organic dyes.

© 2012 OSA

OCIS Codes
(190.0190) Nonlinear optics : Nonlinear optics
(190.4400) Nonlinear optics : Nonlinear optics, materials
(190.4710) Nonlinear optics : Optical nonlinearities in organic materials

ToC Category:
Nonlinear Optical Materials

Original Manuscript: September 26, 2012
Revised Manuscript: November 9, 2012
Manuscript Accepted: November 15, 2012
Published: November 19, 2012

Manuel R. Ferdinandus, Matthew Reichert, Trenton R. Ensley, Honghua Hu, Dmitry A. Fishman, Scott Webster, David J. Hagan, and Eric W. Van Stryland, "Dual-arm Z-scan technique to extract dilute solute nonlinearities from solution measurements," Opt. Mater. Express 2, 1776-1790 (2012)

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